SPP tomography: A simple wide-field nanoscope

Scanning

Volumn 35, Issue 4, 2013, Pages 246-252

  Grave De Peralta, L ^a   Regan, C J ^a,b   Bernussi, A A ^a,b  

^a TEXAS TECH UNIVERSITY   (United States)

^b Texas Tech University   (United States)

Author keywords

imaging; metal coatings; optics; physical sciences; surface analysis; tomography

Indexed keywords

DIFFRACTION LIMITED; IMAGING PROCESSING; NEAR-FIELD FLUORESCENCE; PHYSICAL SCIENCE; PLASMONIC CRYSTALS; SUBWAVELENGTH RESOLUTION; SURFACE EMISSIONS; SURFACE PLASMON POLARITONS;

ELECTROMAGNETIC WAVE POLARIZATION; IMAGING TECHNIQUES; LUNAR SURFACE ANALYSIS; METAL COATINGS; OPTICS; SURFACE ANALYSIS; SURFACE PLASMON RESONANCE;

TOMOGRAPHY;

ARTICLE; FLUORESCENCE; IMAGE PROCESSING; MICROSCOPE; NANOIMAGING; PRIORITY JOURNAL; SUFRACE PLASMON POLARITON TOMOGRAPHY;

EID: 84880330053     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.21057     Document Type: Article

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