Study of plasmonic crystals using Fourier-plane images obtained with plasmon tomography far-field superlenses

Journal of Applied Physics

Volumn 110, Issue 8, 2011, Pages

  Rodriguez, R ^a   Regan, C J ^a,b   Ruiz Columbie A ^a   Agutu, W ^a   Bernussi, A A ^a,b   De Peralta, L Grave ^a  

^a TEXAS TECH UNIVERSITY   (United States)

^b Texas Tech University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTIVE REFRACTIVE INDEX; FAR-FIELD; FILLING FACTOR; HOLE DIAMETER; INFORMATION CONCERNING; PLASMONIC CRYSTALS; QUANTITATIVE CHARACTERIZATION; STOP-BANDS; SUB-WAVELENGTH; SUPERLENSES; SURFACE PLASMON POLARITONS;

CRYSTALS; ELECTROMAGNETIC WAVE POLARIZATION; REFRACTIVE INDEX; SURFACE PLASMON RESONANCE; TOMOGRAPHY;

PLASMONS;

EID: 80655132292     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3654001     Document Type: Article

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