Optimal design of accelerated life testing plans under progressive censoring

IIE Transactions (Institute of Industrial Engineers)

Volumn 45, Issue 11, 2013, Pages 1176-1187

  Zhu, Yada ^a   Elsayed, Elsayed A ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

accelerated life testing; competing risk; Progressive censoring; time to first failure; Weibull distribution

Indexed keywords

ACCELERATED LIFE TESTING; ASYMPTOTIC VARIANCE; COMPETING FAILURE MODES; COMPETING RISKS; OPTIMAL TEST PLANS; PROGRESSIVE CENSORING; RELIABILITY PREDICTION; TIME OF FIRST FAILURES;

WEIBULL DISTRIBUTION;

TESTING;

EID: 84880273830     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/0740817X.2012.725504     Document Type: Article

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