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Volumn 60, Issue 1, 2006, Pages 46-56

Planning step-stress life test with progressively type i group-censored exponential data

Author keywords

Accelerated life test; D optimality; Grouped data; Maximum likelihood method; Progressive censoring; Variance optimality

Indexed keywords


EID: 33644884199     PISSN: 00390402     EISSN: 14679574     Source Type: Journal    
DOI: 10.1111/j.1467-9574.2006.00309.x     Document Type: Article
Times cited : (38)

References (8)
  • 3
    • 0030412238 scopus 로고    scopus 로고
    • Confidence interval for the mean of the exponential distribution, based on grouped data
    • CHEN, Z. and Mi, J. (1996), Confidence interval for the mean of the exponential distribution, based on grouped data, IEEE Transactions on Reliability 45, 671-677.
    • (1996) IEEE Transactions on Reliability , vol.45 , pp. 671-677
    • Chen, Z.1    Mi, J.2
  • 6
    • 0020734526 scopus 로고
    • Optimum simple step stress plans for accelerated life testing
    • MILLER, R. and NELSON, W B. (1983), Optimum simple step stress plans for accelerated life testing, IEEE Transactions on Reliability 32, 59-65.
    • (1983) IEEE Transactions on Reliability , vol.32 , pp. 59-65
    • Miller, R.1    Nelson, W.B.2
  • 8
    • 0032627544 scopus 로고    scopus 로고
    • Planning step-stress life-test with a target acceleration-factor
    • YEO, K.-P. and TANG, L.-C. (1999), Planning step-stress life-test with a target acceleration-factor, IEEE Transactions on Reliability 48, 61-67.
    • (1999) IEEE Transactions on Reliability , vol.48 , pp. 61-67
    • Yeo, K.-P.1    Tang, L.-C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.