Planning multiple levels constant stress accelerated life tests

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2002, Pages 338-342

  Tang, Loon Ching ^a   Yang, Guiyu ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Accelerated testing; Constrained optimization; Contour plot

Indexed keywords

LIFE CYCLE; OPTIMIZATION; PLANNING; PRODUCT DEVELOPMENT; RELIABILITY;

ACCELERATED LIFE TESTS; CONSTRAINED OPTIMIZATION; CONTOUR PLOT;

STRESS ANALYSIS;

EID: 0036129402     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. How to plan an accelerated life test-some practical guidelines
2. Planning for accelerated life tests
3. Optimal constant-stress acculturated life-test plans