메뉴 건너뛰기




Volumn 54, Issue 1, 2005, Pages 58-63

A multiple objective framework for planning accelerated life tests

Author keywords

Goal programming; Multiple objective optimization; Planning accelerated testing

Indexed keywords

MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; OPTIMIZATION; PROBABILITY DISTRIBUTIONS; SENSITIVITY ANALYSIS; STATISTICAL METHODS;

EID: 15544377405     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2004.841731     Document Type: Article
Times cited : (21)

References (13)
  • 1
    • 0003311918 scopus 로고
    • How to Plan an Accelerated Life Test: Some Practical Guidelines
    • (ASQC Basic Reference in Quality Control)
    • W. Q. Meeker and G. J. Hahn, How to Plan an Accelerated Life Test: Some Practical Guidelines, vol. 10, 1985. (ASQC Basic Reference in Quality Control) Statistical Techniques.
    • (1985) Statistical Techniques , vol.10
    • Meeker, W.Q.1    Hahn, G.J.2
  • 2
    • 0016919169 scopus 로고
    • "Theory for optimization censored accelerated life tests for normal and lognormal life distribution"
    • W. Nelson and T. J. Kielpinski, "Theory for optimization censored accelerated life tests for normal and lognormal life distribution," Technometrics, vol. 18, pp. 105-114, 1976.
    • (1976) Technometrics , vol.18 , pp. 105-114
    • Nelson, W.1    Kielpinski, T.J.2
  • 3
    • 0017972683 scopus 로고
    • "Theory for optimum accelerated censored life tests for weibull and extreme value distributions"
    • W. Nelson and W. Q. Meeker, "Theory for optimum accelerated censored life tests for weibull and extreme value distributions," Technometrics, vol. 20, pp. 171-177, 1978.
    • (1978) Technometrics , vol.20 , pp. 171-177
    • Nelson, W.1    Meeker, W.Q.2
  • 4
    • 0016627613 scopus 로고
    • "Optimum censored accelerated life-tests for weibull and extreme value distributions"
    • T. J. Kielpinski and W. Nelson, "Optimum censored accelerated life-tests for weibull and extreme value distributions," IEEE Trans. Reliab., vol. R-24, pp. 321-332, 1975.
    • (1975) IEEE Trans. Reliab. , vol.R-24 , pp. 321-332
    • Kielpinski, T.J.1    Nelson, W.2
  • 5
    • 0012113266 scopus 로고
    • "Planning accelerated life tests for selecting the most reliable product"
    • S. T. Tseng, "Planning accelerated life tests for selecting the most reliable product," J. Statist. Planning Inference, vol. 41, pp. 215-230, 1994.
    • (1994) J. Statist. Planning Inference , vol.41 , pp. 215-230
    • Tseng, S.T.1
  • 7
    • 0037061495 scopus 로고    scopus 로고
    • "Planning accelerated life tests with three constant stress levels"
    • L. C. Tang, A. P. Tan, and S. H. Ong, "Planning accelerated life tests with three constant stress levels," Computers & Industrial Engineering, vol. 42, pp. 439-446, 2002.
    • (2002) Computers & Industrial Engineering , vol.42 , pp. 439-446
    • Tang, L.C.1    Tan, A.P.2    Ong, S.H.3
  • 8
    • 0028515350 scopus 로고
    • "Best compromise test plans for weibull distributions with different censoring times"
    • G. B. Yang and L. Jin, "Best compromise test plans for weibull distributions with different censoring times," Qual. Reliab. Eng. Int., vol. 10, pp. 411-415, 1994.
    • (1994) Qual. Reliab. Eng. Int. , vol.10 , pp. 411-415
    • Yang, G.B.1    Jin, L.2
  • 9
    • 0028730662 scopus 로고
    • "Optimum constant-stress accelerated life-test plans"
    • G. B. Yang, "Optimum constant-stress accelerated life-test plans," IEEE Trans. Reliab., vol. 43, pp. 575-581, 1994.
    • (1994) IEEE Trans. Reliab. , vol.43 , pp. 575-581
    • Yang, G.B.1
  • 10
    • 0029181811 scopus 로고
    • "Failure-censored accelerated life test sampling plans for Weibull distribution under expected test time constraint"
    • D. S. Bai, Y. R. Chun, and J. G. Kim, "Failure-censored accelerated life test sampling plans for Weibull distribution under expected test time constraint," Reliab. Eng. Syst. Saf., vol. 50, pp. 61-68, 1995.
    • (1995) Reliab. Eng. Syst. Saf. , vol.50 , pp. 61-68
    • Bai, D.S.1    Chun, Y.R.2    Kim, J.G.3
  • 11
    • 0026084533 scopus 로고
    • "An optimal design of accelerated life test for exponential distribution"
    • D. S. Bai and S. W. Chung, "An optimal design of accelerated life test for exponential distribution," Reliab. Eng. Syst. Saf., vol. 31, pp. 57-64, 1991.
    • (1991) Reliab. Eng. Syst. Saf. , vol.31 , pp. 57-64
    • Bai, D.S.1    Chung, S.W.2
  • 12
    • 0036129402 scopus 로고    scopus 로고
    • "Planning multiple levels constant stress accelerated life tests"
    • L. C. Tang and G. Yang, "Planning multiple levels constant stress accelerated life tests," Proc. Annu. Reliab. Maintain. Symp., pp. 338-342, 2002.
    • (2002) Proc. Annu. Reliab. Maintain. Symp. , pp. 338-342
    • Tang, L.C.1    Yang, G.2
  • 13
    • 0000077174 scopus 로고
    • "Asymptotically optimum over-stress test to estimate the survival probability at a condition with low expected failure probability"
    • W. Q. Meeker and G. J. Hahn, "Asymptotically optimum over-stress test to estimate the survival probability at a condition with low expected failure probability," Technometrics, vol. 19, pp. 381-399, 1977.
    • (1977) Technometrics , vol.19 , pp. 381-399
    • Meeker, W.Q.1    Hahn, G.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.