Electrostatic Discharge: Understand, Simulate, and Fix ESD Problems: Third Edition

Electrostatic Discharge: Understand, Simulate, and Fix ESD Problems: Third Edition

Volumn , Issue , 2009, Pages 1-299

  Mardiguian, Michel ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84889329023     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9780470495070     Document Type: Book

References (100)

1. Jowett, C. E. Electrostatics in the Electronics Environment. McMillan, New York, 1976.
2. Horvath, A., and Berta, I. Static Elimination. Wiley New York, 1982.
3. Testone, A. Static Electricity in Electronic Industry. Testone Enterprise, Lee, MA. 1981.
4. Jonassen, N. Static Electricity. Applied Physics Laboratory, Technical University of Denmark, 1991.
5. Aguet, M. Décharges d'origine electrostatiqu. Bulletin SEV/VSE 74, Switzerland, 1983.
6. Richman, P. ESD Protection Handbook. Keytek Instrument Corp., 1983.
7. Kirk, W. Eliminate Static Discharges. Electronic Design, March, 1976. p. 80-85.
8. Yenni, D. Huntsman, J. and Mueller, G. 3M Static Products Documentation, 1995.
9. ISO-TC 22, 1989.
10. Simonic, R. Personnel ESD Statistics. IEEE/EMC Symposium, Boulder, CO, 1981.
11. Simonic, R. Furniturel ESD Events Rates. IEEE/EMC Symposium, Santa Clara, CA, 1982. p. 191-197.
12. Byrne, W. An ESD Model for Electronic Systems. IEEE/EMC Symposium, Santa Clara CA. 1982, p. 199-205.
13. Mazdy, T. Static Discharge Modelling. EMC Symposium, Montreux, Switzerland, 1975, p. 134-139.
14. Tucker, T. Spark Initiation Requirements. Annals of New York Academy of Sciences, Vol. 152, Oct. 1968.
15. King, M. Dynamic Waveforms of Personnal ESD. EOS/ESD Symposium, Denver, 1979, p. 78-87.
16. King, M. Pulse Waveforms of Personnel/Furniture ESD. IEEE/EMC Symposium, Santa Clara, CA, 1982, p. 212-219.
17. Hyatt, H. and Mellberg, H. Bringing ESD Testing into the 20th Century. IEEE/EMC Symposium, Santa Clara, CA, 1982, p. 220-225.
18. Ryser, H. and Daout, B. Fast Discharge Mode in ESD. EMC Symposium, Zurich, 1985, p. 41-46.
19. Richman, P., and Tasker, A. ESD Testing: Interface between Simulator and EUT." EMC Symposium, Zurich, 1985, p. 25-30.
20. Frei, S., Senhgaas, M., and Jobava, R. Influence of Speed of Approach and Humidity on Intensity of ESD. EMC Symposium, Zurich, 1999.
21. Pommerenke, D. and Aidam, M. ESD Waveform Calculation of Human & Simulated ESD. Journal of Electrostatics, Vol. 38, Nov. 1996, p. 33-51.
22. Yenni, D. Huntsman, J. and Mueller, G. 3M Static Products Documentation, 1995.
23. Greason, W. ESD Damage in Electronics. Research Study Press, Letchworth, England, 1990.
24. ESD with Passive Components, EMC Technology Magazine, Nov., 1988, p. 45.
25. Vinson, J, Bernier, J., and Croft, G. ESD Design & Analysis Handbook. Kluwer Amsterdam, 2003.
26. Verhage, K. Compound Level ESD Testing. μ Electronics Reliability Journal, 1998.
27. Fukuda, K. VLSI Protection, HBM and MM. EOS/ESD Symposium, 1988.
28. Kelly, M, et al. Comparison of ESD Models for CMOS. EOS/ESD Symposium, 1995.
29. Boissieres, F. Electrical Interface Presentation. ST MiCroElectronics Corp. 2008.
30. Allen, R. How to Set Up an ESD Control Program. Evaluation Engineering Magazine, Feb., 1999.
31. Petrizio. Electrical Overstress vs Device Geometry. EOS/ESD Symposium, Denver, 1979.
32. Branberg, G. ESD and CMOS Logic. EOS/ESD Symposium, Denver, 1979.
33. Denson, D. ESD Testing of Advanced Schottky TTL. EOS/ESD Symposium, Orlando, FL, 1982.
34. Kozlowski, A. Barski, M. and Stulchly, S. Characterization of ESD Tester. IEEE/EMC Symposium, Washington, DC, 1990, p. 270-273.
35. Wilson, P.-Ma, M. Fields Radiated by ESD. IEEE/EMC Transactions, Feb., 1991, p. 10-18.
36. Pommerenke, D., and Aidam, M. ESD Waveform, Field and Current of Human & Simulated ESD. Journal of Electrostatics, Vol. 38, 1996, Nov. 1996 p. 33-51.
37. Smith, D. Unusual Forms of ESD. EOS/ESD Symposium, 1999, Orlando, FL.
38. Pommerenke, D., and Aidam. To What Extent Do Contact Mode and Indirect ESD Test Reproduce Reality? EOS/ESD Symposium, 1995, San Diego CA, p. 101-109.
39. White, D., and Mardiguian, M. EMI Control Methodology & Procedures. ICT, Gainesville, VA, 1989.
40. Verhaege, K., Recommendations to Improvement of HBM Component Test Specification, EOS/ESD Symposium, 1996.
41. Sicard, E., Bendhia, S., and Ramdani, M., EMC of Integrated Circuits. Springer, New York, 2006, Chapter 5.
42. Guidelines for Controlling Spacecraft Charging Effects, NASA Tech. Report, No. 2361.
43. Kocharian, V., and Tolman, D. Express Diagnostic for ESD Simulators. IEEE/EMC Symposium. Boston, 2003, p. 708-712.
44. IEC 61000-4-2 ElectroStatic Discharge Immunity Test (2001+Amendments).
45. Hirata, T., Takahashi, T., and Shibuya, N. Evaluation of Fall Time Restriction of ESD Test Current. IEC Tech. Comm. 77 Report, 2007.
46. Smith, D., Barth, J., and Hyatt, H. Simulators Should Simulate. EOS/ESD Symposium, Orlando, FL, 1996, p. 211
47. Rhoades, W., and Maas, J. New ANSI ESD Standard Overcoming Deficiencies of Worldwide Standards. IEEE/EMC Symposium. Denver, 1998, p. 1078-1081.
48. Pommerenke, D. Characteristics of Human/Metal ESD Ref. and Generators Parameters. IEEE/EMC Transactions, Nov., 2004, p. 498-511.
49. Caniggia, S. and Maradei, F. Circuit Modelling of ESD Generators. IEE Transactions on Industr. Appl., Nov., 2006.
50. Maas, J. S., and Pratt, D., Study of the Repeatability of ESD Simulators. IEEE/EMC Symposium. Washington, 1990, p. 265-269.
51. ANSI C63-16 Standard for ESD Test Methodology and Criteria. Draft, 2005.
52. Mohr, D. How to Compare Old and New ESD Test Methods. EMC Expo, Washington, DC, 1989, p. B.3.9-B.3.14.
53. Honda, M. Characteristics of Low Voltage ESD. EOS/ESD Symposium, Las Vegas, 1991, p. 18.
54. Vrachnas, S. Testing Switches for ESD Simulators. Electronic Test, Feb. 1985, p. 44-52.
55. Calcavecchio, R. A Standard Test to Determine ESD Susceptibility. IEEE/EMC Symposium 1986, San Diego, p. 475-480.
56. Pommerenke, D., and Frei, S. Analysis of Fields on Horizontal Coupling Plane in ESD Test. Journal of ElectroStatics, No. 44, 1998, p. 177-190.
57. Richman, P. A Realistic ESD Test Program. EMC Technology Magazine, July 1983, p. 50.
58. Pratt, D., and Davis, J. ESD Failure Rate Prediction. IEEE/EMC Symposium, San Antonio, 1984.
59. Habiger, E. F. ESD Immunity Testing Reproducibility from a Statistic Point of View. Zurich EMC Symposium. 1995, p. 645-648.
60. Renninger, R. Improved Statistical Method for System Level ESD Test. IEEE/EMC Symposium, Dallas, 1993, p. 20-25.
61. Rittenour, T. J., and Gisin, F. Statistical ESD Test, Using New ANSI Guide. IEEE/EMC Symposium, 1992, Anaheim p. 464-467.
62. Boxleitner, W. ESD and Electronic Equipment, IEEE Press, 1989.
63. Boxleitner, W. Design and Test for ESD Immunity, Based on Actual Equipment Use. EMC Expo, Washington, DC, 1989, P.B.3.15-3.22.
64. Nick, H., Osborn, B., and Chang, Y. W. Diagnostic Effectiveness in Computers Using Deterministic ESD. IEEE/EMC Syposium Washington DC. 1990, p. 274-279.
65. Mardiguian, M. EMI Troubleshooting Techniques. McGraw-Hill, New York, 2000.
66. Smith, D. Investigate System-Level ESD Problems. Test & Measurement World, 1999.
67. Pommerenke, D. Finding the Root Cause of an ESD Upset Event, Design Conference, 2006.
68. Lin, D. Effect of VLSI Scaling on ESD Current Capability. Journal of Electrostatics, July, 1997.
69. Beebe, S. Characterization of ESD Protection Circuits. SemiConductor Research, Tech. Report 94CY707, March, 1998.
70. Sicard, E., and Bendhia, S. Advanced CMOS Cell Design. McGraw-Hill, New York, 2006.
71. Sicard, E., Bendhia, S., Baffreau, S., and Ramdani, M. EMC of Integrated Circuits. Springer, New York, 2006.
72. Malinaric, P. J. Transient Suppressors with Varistor Composite Material. IEEE/EMC Trans., Nov., 1985. p. 191-200
73. Val, C. High Performance Surface-Mount VHSIC Packages. 4th Microcircuits Conference, Kobé, 1986.
74. Ming-Dou, K., Cheng-Cheng, Y., and Pi-Chia, S. On-Chip ESD Detection. IEEE/EMC Trans., Feb., 2008, p. 13-21.
75. Montrose, M. Printed Circuits Board Design for EMC Compliance, 2nd ed. IEEE Press, New York, 2000.
76. Hubbing, T. PCB EMC Design. IEEE/EMC Symposium, Boston, 2003, p. 34-36.
77. Sarto, M. S. Electromagnetic Shielding of Thermoformed Plastics. IEEE/EMC Trans., Nov., 2004, p. 588-596.
78. White, D. R. J., and Mardiguian, M. Electromagnetic Shielding, Vol. 3 EMC Handbook Series, 1988, ICT, Gainesville, VA.
79. Schutz, R. B. Shielding Theory and Practice. IEEE/EMC Trans., Aug., 1988, p. 187-200.
80. Ott, H. Noise Reduction Techniques in Electronic Systems, 2nd Ed. Wiley Interscience, 1988.
81. Faught, A. Shield Evaluation Using Transfer Impedance Technique. IEEE/EMC Symposium, Santa Clara, CA p. 38-44, 1982.
82. Palmgreen, C. Shielded Flat Cables for EMI/ESD Reduction. IEEE/EMC Symposium, Boulder, 1981.
83. Mardiguian, M. Controlling Radiated Emissions by Design, 2nd ed., Kluwer, Boston, 2001.
84. Vance, E. Coupling to Shielded Cables. Wiley, 1978.
85. Tsaliovitch, A. Cables Shields for EMC. Kluwer Academic, Amsterdam, 1999.
86. Charoy, A. Compatibilité ElectroMagnétique. Dunod, Paris, 2000.
87. Boxleitner, W. ESD and Electronic Equipment. IEEE Press, New York, 1999.
88. Carlton, R., Racino, G., and Suchyta, J. Improving Transient Immunity of μ Controllers. FreeScale App. Note #2764, June, 2005.
89. King, M. Mastering ESD System Response. EMC Technology Magazine, 1988, March, p. 53, May, p. 39.
90. Beebe, S. G. Characterization, Modeling and Design of ESD Protection Circuit. SemiConductor Research Corp. T.R., 94SJ116, 1998.
91. Sicard, E., and Bendhia, S. Advanced CMOS Cell Design. McGraw-Hill, New York, 2006.
92. Military Handbook DOD-263. ESD Control Hand Book for Protection of Electrical & Electronic Equipment.
93. Design Considerations for Logic Products. Texas Instruments Application Notes, 1998.
94. National Semiconductor. Application Note AN248.
95. Diep, T., and Durvury, C. Electro Static Discharg. T. I. Application Report SSYA 010, Jan., 2001.
96. Chun, J-H., and Murmann, B. Analysis & Measurements of Signal Distorsion Due to ESD Protection Circuits. IEEE Journal on Solid State Circuits, Oct., 2006.
97. Jonassen, N. Ions. Compliance Engineering Magazine. No. 3, 1999.
98. Bonisch, Kalkner, and Pommerenke, D. Broadband Measurements of ESD Risetimes vs Discharges Mechanisms. Journal of Electro Statics, Oct. 2002.
99. Shinobu, I., Junji, O., and Takashi, I. Breakdown Voltages in Very Small Gap Discharges. Zurich EMC Symposium, 1999.
100. White, D., and Mardiguian, M. EMI Control Methodology & Procedures. ICT, Gainesville, 1989.