SCOPUS 정보 검색 플랫폼

Volumn 1, Issue 27, 2013, Pages 4244-4251

Ultrahigh-sensitivity CdS photoconductors with instant response and ultralow power consumption for detection in low-light environments

(9) Lin, Keng Te a Tseng, Shao Chin a Chen, Hsuen Li a Lai, Yu Sheng b Chen, Szu Huang b Tseng, Yi Chuan a Chu, Ting Wei a Lin, Ming Yu c Lu, Yen Pei c

a NATIONAL TAIWAN UNIVERSITY (Taiwan)

b NATIONAL APPLIED RESEARCH LABORATORIES (Taiwan)

c INSTRUMENT TECHNOLOGY RESEARCH CENTER (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREE OF CRYSTALLIZATION; DISLOCATION DEFECTS; KRF EXCIMER LASER; LOW BIAS VOLTAGE; LOW-LIGHT IMAGES; MICRO-RAMAN SPECTRA; ULTRA-HIGH-SENSITIVITY; ULTRA-LOW POWER CONSUMPTION;

BIAS VOLTAGE; ENERGY GAP; EXCIMER LASERS; PHOTOCONDUCTING MATERIALS;

CADMIUM SULFIDE;

EID: 84879936542 PISSN: 20507534 EISSN: 20507526 Source Type: Journal
DOI: 10.1039/c3tc30520a Document Type: Article

Times cited : (15)

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