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Volumn 5, Issue 3, 2013, Pages

Application of SixNy:Hz (SiN) as index matching layer in a-Si:H thin film solar cells

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION LAYERS; CHEMICAL VAPOUR DEPOSITION; FOURIER TRANSFORM INFRA REDS; REFRACTIVE INDEX MATCHING; REFRACTIVE INDEX OF GLASS; SILICON CONCENTRATION; SPECTROSCOPIC ELLIPSOMETERS; TRANSPARENT CONDUCTING OXIDE ELECTRODES;

EID: 84879898618     PISSN: 19417012     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4807609     Document Type: Conference Paper
Times cited : (14)

References (16)
  • 1
    • 65649122709 scopus 로고    scopus 로고
    • 10.1016/j.tsf.2009.03.056
    • A. G. Aberle, Thin Solid Films 517, 4706 (2009). 10.1016/j.tsf.2009.03. 056
    • (2009) Thin Solid Films , vol.517 , pp. 4706
    • Aberle, A.G.1
  • 8
    • 84879626964 scopus 로고    scopus 로고
    • Optical and structural properties of ammonia-free amorphous silicon nitride thin films for photovoltaic applications," (published online). 10.1080/00387010.2012.758639
    • N. Ahmed, C. B. Singh, S. Bhattacharya, S. Dhara, and P. B. Bhargav, "Optical and structural properties of ammonia-free amorphous silicon nitride thin films for photovoltaic applications," Spectrosc. Lett. (published online). 10.1080/00387010.2012.758639
    • Spectrosc. Lett.
    • Ahmed, N.1    Singh, C.B.2    Bhattacharya, S.3    Dhara, S.4    Bhargav, P.B.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.