Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data

Proceedings - Design Automation Conference

Volumn , Issue , 2013, Pages

  Wang, Fa ^a   Zhang, Wangyang ^a   Sun, Shupeng ^a   Li, Xin ^a   Gu, Chenjie ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN INFERENCE; COMPUTATIONAL COSTS; HIGH-DIMENSIONAL; MIXED-SIGNAL CIRCUITS; MODELING TECHNIQUE; PERFORMANCE CORRELATION; PERFORMANCE MODELING; PROCESS VARIATION;

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; INFERENCE ENGINES;

BAYESIAN NETWORKS;

EID: 84879866161     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2463209.2488812     Document Type: Conference Paper

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