Application-specific worst case corners using response surfaces and statistical models

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 24, Issue 9, 2005, Pages 1372-1380

  Sengupta, Manidip ^a   Saxena, Sharad ^a   Daldoss, Lidia ^a   Kramer, Glenn ^a   Minehane, Sean ^a   Cheng, Jianjun ^a  

^a PDF Solutions   (United States)

Author keywords

Application specific integrated circuits; Circuit modeling; Semiconductor device modeling; Sensitivity; Tolerance analysis

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; FITS AND TOLERANCES; INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR DEVICE MODELS; SENSITIVITY ANALYSIS; STATISTICAL METHODS; SURFACE PHENOMENA;

CIRCUIT MODELING; CIRCUIT SIMULATION; SEMICONDUCTOR DEVICE MODELING; TOLERANCE ANALYSIS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 27644479818     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.852037     Document Type: Article

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