Principle hessian direction based parameter reduction with process variation

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2007, Pages 632-637

  Mitev, Alex ^a   Marefat, Michael ^a   Ma, Dongsheng ^a   Wang, Janet M ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRIC NETWORK ANALYSIS;

CIRCUIT PERFORMANCES; CMOS TECHNOLOGIES; COMPUTER-AIDED DESIGN; INTERNATIONAL CONFERENCES; MEAN VALUE; NANO-METER REGIMES; NEW APPROACHES; PARAMETER REDUCTION; PERFORMANCE BASED; PRINCIPLE COMPONENT ANALYSIS; PROCESS VARIATIONS;

ERROR ANALYSIS;

EID: 50249147886     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2007.4397336     Document Type: Conference Paper

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