Low-temperature (<300 C) growth and characterization of single-[100]-oriented Mn-Co-Ni-O thin films

Materials Letters

Volumn 107, Issue , 2013, Pages 103-106

  Ji, Guang ^a,b,c   Chang, Aimin ^a,b   Xu, Jinbao ^a,b   Zhang, Huimin ^a,b   Hou, Juan ^a,b,c   Zhang, Bo ^a,b,c   Zhao, Pengjun ^a,b,c  

^a XINJIANG TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Electrical properties; Negative temperature coefficient thermistor; Structural properties; Thin films

Indexed keywords

CRYSTALLOGRAPHIC ORIENTATIONS; ELECTRON CONDUCTION; ELECTRON TRANSPORT; LASER MOLECULAR BEAM EPITAXY; OPTIMUM TEMPERATURE; ROOT MEAN SQUARE ROUGHNESS; STRUCTURAL AND ELECTRICAL PROPERTIES; THERMALLY OXIDIZED;

AMORPHOUS SILICON; ELECTRIC PROPERTIES; INFRARED DETECTORS; MANGANESE; MOLECULAR BEAM EPITAXY; NEGATIVE TEMPERATURE COEFFICIENT; NICKEL; STRUCTURAL PROPERTIES; THERMISTORS;

THIN FILMS;

EID: 84879476924     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2013.05.079     Document Type: Article

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