Optical properties of Mn1.56 Co0.96 Ni0.48 O4 films studied by spectroscopic ellipsometry

Applied Physics Letters

Volumn 94, Issue 1, 2009, Pages

  Gao, Y Q ^a   Huang, Z M ^a   Hou, Y ^a   Wu, J ^a   Ge, Y J ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; EQUATIONS OF STATE; MANGANESE; MANGANESE COMPOUNDS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; TRANSITION METAL COMPOUNDS; TRANSITION METALS;

CHEMICAL SOLUTION DEPOSITION METHODS; CRITICAL POINTS; OPTICAL FUNCTIONS;

COBALT;

EID: 58149522474     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3064133     Document Type: Article

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