Low temperature crystallization of metastable nickel manganite spinel thin films

Journal of the American Ceramic Society

Volumn 95, Issue 8, 2012, Pages 2562-2567

  Ko, Song Won ^a   Schulze, Heidi M ^a   Saint John, David B ^a   Podraza, Nikolas J ^b   Dickey, Elizabeth C ^c   Trolier Mckinstry, Susan S ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED FILMS; ANNEALING CONDITION; CHEMICAL SOLUTION DEPOSITION; COMPLEX DIELECTRIC FUNCTIONS; ELECTRICAL RESISTIVITY; FILM DENSITY; LOW-TEMPERATURE CRYSTALLIZATION; MANGANITE FILMS; MATERIAL STABILITY; POST-DEPOSITION; SPECTRAL RANGE; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; SPINEL PHASE; TEMPERATURE COEFFICIENT OF RESISTANCE;

ANNEALING; ELECTRIC CONDUCTIVITY; MANGANESE; MANGANESE OXIDE; SINTERING; SPECTROSCOPIC ELLIPSOMETRY; TRANSMISSION ELECTRON MICROSCOPY;

NICKEL;

EID: 84864676901     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2012.05201.x     Document Type: Conference Paper

References (39)

1. R. De Waard, and, E. M. Wormser, " Thermal Radiation Detectors "; p. 1470 in Proceedings of the IRE, Vol. 47 [9], paper 4.1.3. 1959.
2. E. D. Macklen, Thermistors. Electrochemical Publications LTD, Scotland, 1979.
3. 4 (0 ≤ x+x'≤1; M and N Being Ni, Co or Cu). Aging Phenomenon Study," J. Mater. Sci., 35, 4705-11 (2000).
4. 4 Negative Temperature Coefficient Thermistor Thick Films Fabricated by Aerosol-Deposition," J. Am. Ceram. Soc., 92 [ 12 ] 3084-7 (2009).
5. A. Feteira, " Negative Temperature Coefficient Resistance (NTCR) Ceramic Thermistors: An Industrial Perspective," J. Am. Ceram. Soc., 92 [ 5 ] 967-83 (2009).
6. A. J. Moulson, and, J. M. Herbert, Electroceramics, 2nd edition, John Wiley and Sons Ltd., West Sussex, England, 2003.
7. H. Schulze, J. Li, E. C. Dickey, and, S. Trolier-McKinstry, " Synthesis, Phase Characterization, and Properties of Chemical Solution-Deposited Nickel Manganite Thermistor Thin Films," J. Am. Ceram. Soc., 92 [ 3 ] 738-44 (2009).
8. S. W. Ko, J. Li, N. J. Podraza, E. C. Dickey, and, S. Trolier-McKinstry, " Spin Spray-Deposited Nickel Manganite Thermistor Films For Microbolometer Applications," J. Am. Ceram. Soc., 94 [ 2 ] 516-23 (2011).
9. 4 Revisited," J. Less-Common Metals, 156, 357-68 (1989).
10. 2," J. Inorg. Nucl. Chem., 26, 1369-77 (1964).
11. C. Chanel, S. Fritsch, and, C. Drouet, " Synthesis, Thermogravimetric and High Temperature X-Ray Diffraction Analyses of Zinc-Substituted Nickel Manganites," Mater. Res. Bull., 35 [ 3 ] 431-9 (2000).
12. J. deVidales, R. Rojas, E. Vila, and, O. Garcia-Martinez, " Low Temperature Synthesis of Tetragonal Nickel Manganite Spinels: Thermal Behavior and Reactivity," Mater. Res. Bull., 29 [ 11 ] 1163-73 (1994).
13. J. Caniou, Passive Infrared Detection Theory & Applications. Kluwer Academic Publishers, Dordrecht, The Netherlands, 1999.
14. X. M. Liu, H. J. Fang, and, L. T. Liu, " Study on New Structure Uncooled a-Si Microbolometer for Infrared Detection," Microelectron. J., 38 [ 6-7 ] 735-9 (2007).
15. P. Umadevi, and, C. L. Nagendra, " Preparation and Characterization of Transition Metal Oxide Micro-Thermistors and Their Application to Immersed Thermistor Bolometer Infrared Detectors," Sens. Actuators A, 96, 114-24 (2002).
16. R. J. Choudhary, A. S. Ogale, S. R. Shinde, S. Hullavarad, S. B. Ogale, and, T. Venkatesan, " Evaluation of Manganite Films on Silicon for Uncooled Bolometric Applications," Appl. Phys. Lett., 84, 3846-8 (2004).
17. 3 Solid Solution," J. Eur. Ceram. Soc., 22, 567-72 (2002).
18. 3," Solid State Sci., 8, 137-41 (2006).
19. A. Rogalski, Infrared Photon Detectors. SPIE Optical Engineering Press, Bellingham, Washington, 1995.
20. J. B. Goodenough, and, A. L. Loeb, " Theory of Ionic Ordering, Crystal Distortion, and Magnetic Exchange Due to Covalent Forces in Spinels," Phys. Rev., 98, 391-408 (1955).
21. 4+δ," J. Eur. Ceram. Soc., 24, 1233-6 (2004).
22. 4+ Ions on Octahedral Sites of the Spinel Structure," Solid State Ionics, 51, 7-9 (1992).
23. D. A. Kukuruznyak, J. G. Moyer, and, F. S. Ohuchi, " Improved Aging Characteristics of NTC Thermistor Thin Films Fabricated by a Hybrid Sol-Gel-MOD Process," J. Am. Ceram. Soc., 89, 189-92 (2006).
24. J. Lee, P. I. Rovira, I. An, and, R. W. Collins, " Rotating-Compensator Multichannel Ellipsometry: Applications for Real Time Stokes Vector Spectroscopy of Thin Film Growth," Rev. Sci. Instrum., 69, 1800 (1998).
25. B. Johs, J. A. Woollam, C. M. Herzinger, J. N. Hilfiker, R. Synowicki, and, C. Bungay, " Overview of Variable Angle Spectroscopic Ellipsometry(VASE), Part II: Advanced Applications," Proc. Soc. Photo-Opt. Instrum. Eng., 72, 29 (1999).
26. Y. Cong, I. An, K. Vedam, and, R. W. Collins, " Optical Characterization of a 4-Medium Thin-Film Structure by Real-Time Spectroscopic Ellipsometry-Amorphous-Carbon on Tantalum," Appl. Opt., 30, 2692-703 (1991).
27. G. E. Jellison Jr., and, F. A. Modine, " Parameterization of the Optical Functions of Amorphous Materials in the Interband Region," Appl. Phys. Lett., 69, 371-3 (1996).
28. G. E. Jellison Jr., and, F. A. Modine, " Erratum: Parameterization of the Optical Functions of Amorphous Materials in the Interband Region," Appl. Phys. Lett., 69, 2137 (1996).
29. R. W. Collins, and, A. S. Ferlauto, " Optical Physics of Materials "; pp. 125-9 in Handbook of Ellipsometry, Edited by, H. G. Tompkins, and, E. A. Irene,. William Andrew, Norwich, NY, 2005
30. H. Fujiwara, J. Koh, P. I. Rovira, and, R. W. Collins, " Assessment of Effective-Medium Theories in the Analysis of Nucleation and Microscopic Surface Roughness Evolution for Semiconductor Thin Films," Phys. Rev. B, 61, 10832-44 (2000).
31. C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and, W. P. Paulson, " Ellipsometric Determination of Optical Constants for Silicon and Thermally Grown Silicon Dioxide via a Multi-Sample, Multi-Wavelength, Multi-Angle Investigation," J. Appl. Phys., 83, 3323-36 (1998).
32. N. J. Podraza, D. B. Saint John, S. W. Ko, H. M. Schulze, J. Li, E. C. Dickey, and, S. Trolier-McKinstry, " Optical and Structural Properties of Solution Deposited Nickel Manganite Thin Films," Thin Solid Films, 519, 2919-23 (2011).
33. 3 (R=La; M=Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu)," J. Phys. Soc. Jpn., 64, 2488-501 (1995).
34. T. W. Noh, J. H. Jung, and, K. H. Kim, " Optical Physics of Collosal Magnetoresistance Manganites "; pp. 177-200 in Physics of Manganites, Edited by, T. A. Kaplan, and, S. D. Mahanti,. Kluwer Academic/Plenum Publishers, New York, NY, 1999
35. A. S. Moskvin, and, I. L. Avvakumov, " Doped Manganites Beyond Conventional Double-Exchange Model," Phys. B, 322, 371-89 (2002).
36. E. Ganshina, N. Loshkareva, Y. Sukhorukov, E. Mostovshchikova, A. Vinogradov, and, L. Nomerovannaya, " Optical and Magneto-Optical Spectroscopy of Manganites," J. Magn. Magn. Mater., 300, 62-6 (2006).
37. E. A. Balykina, E. A. Ganshina, G. S. Krichik, A. Y. Trifonov, and, I. O. Troyanchuk, " Magneto-Optical Properties of New Manganese Oxide Compounds," J. Magn. Magn. Mater., 117, 259-69 (1992).
38. P. Fau, J. P. Bonino, J. J. Demai, and, A. Rousset, " Thin Films of Nickel Manganese Oxide for NTC Thermistor Applications," Appl. Surf. Sci., 65/66, 319-24 (1993).
39. M. Parlak, T. Hashemi, M. J. Hogan, and, A. W. Brinkman, " Effect of Heat Treatment on Nickel Manganite Thin Film Thermistors Deposited by Electron Beam Evaporation," Thin Solid Films, 345 [ 2 ] 307-11 (1999).