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Volumn 65, Issue 11, 2011, Pages 1632-1635

Effects of annealing temperature on microstructure and electrical properties of Mn-Co-Ni-O thin films

Author keywords

Electrical properties; Microstructure; Thin film

Indexed keywords

ANNEALING TEMPERATURES; CHEMICAL SOLUTION DEPOSITION METHOD; ELECTRICAL PROPERTY; INTEGRATED DEVICE;

ANNEALING; COBALT; ELECTRIC PROPERTIES; MANGANESE; MICROSTRUCTURE; THIN FILMS; VAPOR DEPOSITION;

FILM PREPARATION;

EID: 79953183441 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/j.matlet.2011.03.029 Document Type: Article

Times cited : (52)

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