Structure-properties correlation in Si nanoparticles by total scattering and computer simulations

Chemistry of Materials

Volumn 25, Issue 11, 2013, Pages 2365-2371

  Petkov, Valeri ^a   Hessel, Colin M ^b   Ovtchinnikoff, Justine ^b   Guillaussier, Adrien ^b   Korgel, Brian A ^b   Liu, Xiaofeng ^c   Giordano, Cristina ^c  

^a CENTRAL MICHIGAN UNIVERSITY   (United States)

^b The University of Texas at Austin   (United States)

^c MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

atomic PDFs analysis; nanoparticle structure modeling; optical properties nanostructure correlation; Si nanoparticles; synchrotron X ray diffraction

Indexed keywords

ATOMIC PAIR DISTRIBUTION FUNCTIONS; ATOMIC PDFS ANALYSIS; ATOMIC SCALE STRUCTURES; HIGH-ENERGY SYNCHROTRON X-RAYS; NANOPARTICLE STRUCTURES; PHOTOLUMINESCENCE EMISSION; SI NANOPARTICLES; SYNCHROTRON X RAY DIFFRACTION;

ATOMS; COMPUTER SIMULATION; NANOPARTICLES; OPTICAL PROPERTIES; SILICON; SURFACE CHEMISTRY; SYNCHROTRON RADIATION; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

CRYSTAL ATOMIC STRUCTURE;

EID: 84879029290     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm401099q     Document Type: Article

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