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Volumn 116, Issue 42, 2012, Pages 22463-22468

Graphene-supported high-resolution TEM and STEM imaging of silicon nanocrystals and their capping ligands

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC STRAIN; ATOMIC NUMBERS; CAPPING LIGANDS; CRYSTALLINE SI; HIGH RESOLUTION; HIGH-RESOLUTION TEM; LATTICE DISTORTIONS; LIGAND-STABILIZED; ORGANIC CAPPING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SI NANOCRYSTAL; SILICON NANOCRYSTALS; TEM IMAGES; ULTRA-THIN;

EID: 84867870369     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp308545q     Document Type: Article
Times cited : (74)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.