Real-time probe based quantitative determination of material properties at the nanoscale

Nanotechnology

Volumn 24, Issue 26, 2013, Pages

  Saraswat, G ^a   Agarwal, P ^b   Haugstad, G ^c   Salapaka, M V ^a  

^a University of Minnesota   (United States)

^b GE GLOBAL RESEARCH   (United States)

^c UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISSIPATIVE PROPERTIES; EQUIVALENT-LINEAR; MULTI-FREQUENCY EXCITATION; MULTIPLE MATERIALS; PERTURBATION ANALYSIS; QUANTITATIVE DETERMINATIONS; STIFFNESS PROPERTIES; TAILORING MATERIALS;

FREQUENCY ESTIMATION; MATERIALS; NANOTECHNOLOGY; PROBES; STIFFNESS;

NANOSTRUCTURED MATERIALS;

EID: 84878710723     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/26/265706     Document Type: Article

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