Responsivity measurements of N-on-P and P-on-N silicon photomultipliers in the continuous wave regime

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8629, Issue , 2013, Pages

  Adamo, Gabriele ^a   Agrò, Diego ^a   Stivala, Salvatore ^a   Parisi, Antonino ^a   Giaconia, Costantino ^a   Busacca, Alessandro ^a   Mazzillo, Massimo C ^b   Sanfilippo, Delfo ^b   Fallica, Pier Giorgio ^b  

^a UNIVERSITY OF PALERMO   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

Continuous Wave Regime; Optical Characterization; Photodetector; Responsivity; Silicon Photomultiplier (SiPM)

Indexed keywords

CONTINUOUS WAVE; LINEAR BEHAVIOR; OPTICAL CHARACTERIZATION; PLANAR TECHNOLOGY; RESPONSIVITY; RESPONSIVITY MEASUREMENTS; REVERSE BIAS VOLTAGE; SILICON PHOTOMULTIPLIER;

PHOTODETECTORS; PHOTOMULTIPLIERS; PHOTONIC DEVICES; PHOTONICS;

SILICON;

EID: 84878365246     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.2001606     Document Type: Conference Paper

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