Characterization of a novel 100-channel silicon photomultiplier - Part I: Noise

IEEE Transactions on Electron Devices

Volumn 55, Issue 10, 2008, Pages 2757-2764

  Finocchiaro, Paolo ^a   Pappalardo, Alfio ^a,b   Cosentino, Luigi ^a,b   Belluso, Massimiliano ^c   Billotta, Sergio ^b,c   Bonanno, Giovanni ^c   Carbone, Beatrice ^b   Condorelli, Giovanni ^b   Di Mauro, Salvatore ^c   Fallica, Giorgio ^b   Mazzillo, Massimo ^b   Piazza, Alessandro ^b   Sanfilippo, Delfo ^b   Valvo, Giuseppina ^b  

^a INFN LABORATORI NAZIONALI DEL SUD   (Italy)

^b STMICROELECTRONICS   (Italy)

^c INAF OSSERVATORIO ASTROFISICO DI CATANIA   (Italy)

Author keywords

Afterpulsing; Dark noise; Gain; Quantum detection efficiency; Quenching resistor; Silicon photomultiplier (SiPM); Single photon avalanche photodiode (SPAD); Single photon counting

Indexed keywords

AVALANCHES (SNOWSLIDES); ELECTROMAGNETIC WAVES; PARTICLE BEAMS; PHOTOMULTIPLIERS; SILICON; SNOW;

AFTERPULSING; DARK NOISE; GAIN; QUANTUM DETECTION EFFICIENCY; QUENCHING RESISTOR; SILICON PHOTOMULTIPLIER (SIPM); SINGLE-PHOTON AVALANCHE PHOTODIODE (SPAD); SINGLE-PHOTON COUNTING;

PHOTONS;

EID: 53649100688     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2003996     Document Type: Article

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