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Volumn 49, Issue 3, 2002, Pages 387-394

Low-noise silicon avalanche photodiodes fabricated in conventional CMOS technologies

Author keywords

Avalanche breakdown; Avalanche photodiodes; Complementary metal oxide semiconductor (CMOS) integrated circuits; Noise; Photodetectors; Silicon; Ultraviolet detectors

Indexed keywords

AVALANCHE DIODES; CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; PHOTODETECTORS; QUANTUM EFFICIENCY; ULTRAVIOLET RADIATION;

EID: 0036494162     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.987107     Document Type: Article
Times cited : (144)

References (20)
  • 15
    • 0006213173 scopus 로고    scopus 로고
    • Online


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.