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Volumn 49, Issue 3, 2002, Pages 387-394
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Low-noise silicon avalanche photodiodes fabricated in conventional CMOS technologies
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Author keywords
Avalanche breakdown; Avalanche photodiodes; Complementary metal oxide semiconductor (CMOS) integrated circuits; Noise; Photodetectors; Silicon; Ultraviolet detectors
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Indexed keywords
AVALANCHE DIODES;
CMOS INTEGRATED CIRCUITS;
ELECTRIC POTENTIAL;
PHOTODETECTORS;
QUANTUM EFFICIENCY;
ULTRAVIOLET RADIATION;
AVALANCHE BREAKDOWN;
PHOTODIODES;
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EID: 0036494162
PISSN: 00189383
EISSN: None
Source Type: Journal
DOI: 10.1109/16.987107 Document Type: Article |
Times cited : (144)
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References (20)
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