-
4
-
-
85037352802
-
A Practical Device Authentication Scheme Using SRAM PUFs
-
P. Koeberl, J. Li, A. Rajan, C. Vishik and W. Wu, "A Practical Device Authentication Scheme Using SRAM PUFs," Proceedings of the 4th International Conference on Trust and Trustworthy Computing, pp. 63-77, 2011.
-
(2011)
Proceedings of the 4th International Conference on Trust and Trustworthy Computing
, pp. 63-77
-
-
Koeberl, P.1
Li, J.2
Rajan, A.3
Vishik, C.4
Wu, W.5
-
5
-
-
84974661400
-
Extracting Device Fingerprints from Flash Memory by Exploiting Physical Variations
-
P. Prabhu, A. Akel, L. M. Grupp, W.-K. S. Yu, G. E. Suh, E. Kan and S. Swanson, "Extracting Device Fingerprints from Flash Memory by Exploiting Physical Variations," Proceedings of the 4th International Conference on Trust and Trustworthy Computing, pp. 1-17, 2011.
-
(2011)
Proceedings of the 4th International Conference on Trust and Trustworthy Computing
, pp. 1-17
-
-
Prabhu, P.1
Akel, A.2
Grupp, L.M.3
Yu, W.-K.S.4
Suh, G.E.5
Kan, E.6
Swanson, S.7
-
6
-
-
0012278046
-
Noise in Solid-State Microstructures: A New Perspective on Individual Defects, Interface States and Low-Frequency Noise
-
M. J. Kirton and M. J. Uren, "Noise in Solid-State Microstructures: A New Perspective on Individual Defects, Interface States and Low-Frequency Noise," Advances in Physics, vol. 38, pp. 367-468, 1989.
-
(1989)
Advances in Physics
, vol.38
, pp. 367-468
-
-
Kirton, M.J.1
Uren, M.J.2
-
7
-
-
34249807647
-
Random telegraph signal in flash memory: Its impact on scaling of multilevel flash memory beyond the 90-nm node
-
DOI 10.1109/JSSC.2007.897158
-
H. Kurata, K. Otsuga, A. Kotabe, S. Kajiyama, T. Osabe, Y. Sasago, S. Narumi, K. Tokami, S. Kamohara and O. Tsuchiya, "Random Telegraph Signal in Flash Memory: Its Impact on Scaling of Multilevel Flash Memory Beyond the 90-nm Node," Solid-State Circuits, IEEE Journal of, vol. 42, no. 6, pp. 1362-1369, 2007. (Pubitemid 46853244)
-
(2007)
IEEE Journal of Solid-State Circuits
, vol.42
, Issue.6
, pp. 1362-1369
-
-
Kurata, H.1
Otsuga, K.2
Kotabe, A.3
Kajiyama, S.4
Osabe, T.5
Sasago, Y.6
Narumi, S.7
Tokami, K.8
Kamohara, S.9
Tsuchiya, O.10
-
8
-
-
69949152635
-
Random Telegraph Noise Effect on the Programmed Threshold-Voltage Distribution of Flash Memories
-
C. Compagnoni, M. Ghidotti, A. Lacaita, A. Spinelli and A. Visconti, "Random Telegraph Noise Effect on the Programmed Threshold-Voltage Distribution of Flash Memories," Electron Device Letters, IEEE, vol. 30, no. 9, pp. 984-986, 2009.
-
(2009)
Electron Device Letters, IEEE
, vol.30
, Issue.9
, pp. 984-986
-
-
Compagnoni, C.1
Ghidotti, M.2
Lacaita, A.3
Spinelli, A.4
Visconti, A.5
-
9
-
-
78650942208
-
Threshold Voltage Fluctuation by Random Telegraph Noise in Floating Gate nand Flash Memory String
-
S.-M. Joe, J.-H. Yi, S.-K. Park, H. Shin, B.-G. Park, Y. J. Park and J.-H. Lee, "Threshold Voltage Fluctuation by Random Telegraph Noise in Floating Gate nand Flash Memory String," Electron Devices, IEEE Transactions on, vol. 58, no. 1, pp. 67-73, 2011.
-
(2011)
Electron Devices, IEEE Transactions on
, vol.58
, Issue.1
, pp. 67-73
-
-
Joe, S.-M.1
Yi, J.-H.2
Park, S.-K.3
Shin, H.4
Park, B.-G.5
Park, Y.J.6
Lee, J.-H.7
-
11
-
-
79959299921
-
Understanding of Traps Causing Random Telegraph Noise Based on Experimentally Extracted Time Constants and Amplitude
-
T. K. Abe, A. Sugawa and S. Ohmi, "Understanding of Traps Causing Random Telegraph Noise Based on Experimentally Extracted Time Constants and Amplitude," in Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, 2011.
-
Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, 2011
-
-
Abe, T.K.1
Sugawa, A.2
Ohmi, S.3
-
12
-
-
0001187026
-
Temperature-independent switching rates for a random telegraph signal in a silicon metal-oxide-semiconductor field-effect transistor at low temperatures
-
J. H. Scofield, N. Borland and D. M. Fleetwood, "Temperature- independent switching rates for a random telegraph signal in a silicon metal-oxide-semiconductor field-effect transistor at low temperatures," Applied Physics Letters, vol. 76, no. 22, pp. 3248-3250, 2000.
-
(2000)
Applied Physics Letters
, vol.76
, Issue.22
, pp. 3248-3250
-
-
Scofield, J.H.1
Borland, N.2
Fleetwood, D.M.3
-
14
-
-
85175130697
-
-
Available
-
Texas Instruments Incorporated, "OMAP Mobile Processors," [Online]. Available: http://focus.ti.com/general/docs/gencontent.tsp?contentId= 46946.
-
"OMAP Mobile Processors," [Online]
-
-
-
15
-
-
85175134258
-
-
EE Times.com, 17 February Online. Available
-
EE Times.com, "U.S.: Fake parts threaten electronic market," 17 February 2010. [Online]. Available: http://www.eetimes.com/electronics-news/ 4087628/U-S-Fake-parts-threaten-electronic-market.
-
(2010)
U.S.: Fake Parts Threaten Electronic Market
-
-
-
16
-
-
85175130194
-
-
FrankenFlash Project, Available
-
FrankenFlash Project, "SOSFakeFlash," [Online]. Available: http://sosfakeflash.wordpress.com/.
-
"SOSFakeFlash," [Online]
-
-
-
17
-
-
52149117439
-
Fuzzy Extractors: How to Generate Strong Keys from Biometrics and and Other Noisy Data
-
Y. Dodis, L. Reyzin and A. Smith, "Fuzzy Extractors: How to Generate Strong Keys from Biometrics and and Other Noisy Data," SIAM Journal of Computing, vol. 38, no. 1, pp. 97-139, 2008.
-
(2008)
SIAM Journal of Computing
, vol.38
, Issue.1
, pp. 97-139
-
-
Dodis, Y.1
Reyzin, L.2
Smith, A.3
-
18
-
-
85008060937
-
A provably secure true random number generator with built-in tolerance to active attacks
-
B. Sunar, W. J. Martin and D. R. Stinson, "A provably secure true random number generator with built-in tolerance to active attacks," in IEEE Transactions on Computers, 2007.
-
(2007)
IEEE Transactions on Computers
-
-
Sunar, B.1
Martin, W.J.2
Stinson, D.R.3
-
23
-
-
0036474722
-
Impact of die-to-die and within die parameter fluctuations on maximum clock frequency distribution for gigascale integration
-
K. A. Bowman, S. G. Duvall and J. D. Meindl, "Impact of die-to-die and within die parameter fluctuations on maximum clock frequency distribution for gigascale integration," Journal of Solid-State Circuits, vol. 37, no. 2, pp. 183-190, 2002.
-
(2002)
Journal of Solid-State Circuits
, vol.37
, Issue.2
, pp. 183-190
-
-
Bowman, K.A.1
Duvall, S.G.2
Meindl, J.D.3
-
26
-
-
0038341105
-
Silicon Physical Random Functions
-
B. Gassend, D. Clarke, M. van Dijk and S. Devadas, "Silicon Physical Random Functions," in Proceedings of the Computer and Communication Security Conference, New York, 2002.
-
Proceedings of the Computer and Communication Security Conference, New York, 2002
-
-
Gassend, B.1
Clarke, D.2
Van Dijk, M.3
Devadas, S.4
-
27
-
-
4544381402
-
A technique to build a secret key in integrated circuits for identification and authentication application
-
J. W. Lee, D. Lim, B. Gassend, G. E. Suh, M. van Dijk and S. Devadas, "A technique to build a secret key in integrated circuits for identification and authentication application," in Proceedings of the Symposium on VLSI Circuits, 2004.
-
Proceedings of the Symposium on VLSI Circuits, 2004
-
-
Lee, J.W.1
Lim, D.2
Gassend, B.3
Suh, G.E.4
Van Dijk, M.5
Devadas, S.6
|