Microstructural characterization of whiskers and oxidized surfaceson Sn/FeNi42 and Pb-free alloys

CARTS Europe 2006

Volumn , Issue , 2006, Pages 237-243

  Sosiati, H ^a   Hata, S ^a   Kuwano, N ^a   Iwane, Y ^b   Morizono, Y ^b   Ohno, Y ^b  

^a KYUSHU UNIVERSITY   (Japan)

^b KUMAMOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY; CROSS-SECTIONAL TEM; FORMATION MECHANISM; HIGH-RESOLUTION TEM; MICRO-STRUCTURAL CHARACTERIZATION; POLYCRYSTALLINE; TEMPERATURE RANGE; VARIOUS ATMOSPHERE;

CERIUM ALLOYS; CRYSTALLINE MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; LEAD; TIN PLATE;

TIN;

EID: 84878072214     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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