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Volumn 53, Issue 5, 2004, Pages 541-544
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Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate
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Author keywords
Focused ion beam; Ni3Sn4 precipitate; Pb free; Scanning ion microscopy; Tin plating; Transmission electron microscopy; Whisker growth
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Indexed keywords
IRON;
NICKEL;
TIN;
ARTICLE;
CHEMISTRY;
LABORATORY DIAGNOSIS;
TRANSMISSION ELECTRON MICROSCOPY;
IRON;
MICROSCOPY, ELECTRON, TRANSMISSION;
NICKEL;
SPECIMEN HANDLING;
TIN;
BINARY ALLOYS;
FOCUSED ION BEAMS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MICROSTRUCTURE;
PRECIPITATES;
SCANNING ELECTRON MICROSCOPY;
TIN ALLOYS;
FOCUSED ION BEAM ETCHING;
FOCUSED IONS BEAMS;
MECHANICAL DAMAGES;
MICROSAMPLING;
NI SUBSTRATES;
NI3SN4 PRECIPITATE;
PB-FREE;
SCANNING ION MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY OBSERVATION;
WHISKER GROWTH;
IONS;
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EID: 13444279093
PISSN: 00220744
EISSN: None
Source Type: Journal
DOI: 10.1093/jmicro/dfh064 Document Type: Article |
Times cited : (3)
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References (9)
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