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Volumn 53, Issue 5, 2004, Pages 541-544

Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate

Author keywords

Focused ion beam; Ni3Sn4 precipitate; Pb free; Scanning ion microscopy; Tin plating; Transmission electron microscopy; Whisker growth

Indexed keywords

IRON; NICKEL; TIN;

EID: 13444279093     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfh064     Document Type: Article
Times cited : (3)

References (9)
  • 1
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    • Glazunova V K and Gorbunova KM (1971) Spontaneous growth of whiskers from electrodeposited coatings. J. Crystal Growth. 10: 85-90.
    • (1971) J. Crystal Growth , vol.10 , pp. 85-90
    • Glazunova, V.K.1    Gorbunova, K.M.2
  • 2
    • 13444286539 scopus 로고
    • Whisker formation on electronic materials
    • Dunn B D (1976) Whisker formation on electronic materials. Circuit World. 2: 32-40.
    • (1976) Circuit World , vol.2 , pp. 32-40
    • Dunn, B.D.1
  • 4
    • 0032083872 scopus 로고    scopus 로고
    • Spontaneous growth mechanism of tin whiskers
    • Lee B Z and Lee D N (1998) Spontaneous growth mechanism of tin whiskers. Acta Mater. 46: 3701-3714.
    • (1998) Acta Mater. , vol.46 , pp. 3701-3714
    • Lee, B.Z.1    Lee, D.N.2
  • 6
    • 0034921084 scopus 로고    scopus 로고
    • Minimization of tin whisker formation for lead-free electronics finishing
    • Schetty R (2001) Minimization of tin whisker formation for lead-free electronics finishing. Circuit World. 27: 17-20.
    • (2001) Circuit World , vol.27 , pp. 17-20
    • Schetty, R.1
  • 7
    • 0037999858 scopus 로고    scopus 로고
    • Electron microscopy study of tin whisker growth
    • LeBret J B and Norton M G (2003) Electron microscopy study of tin whisker growth. J. Mater. Res. 18: 585-593.
    • (2003) J. Mater. Res. , vol.18 , pp. 585-593
    • LeBret, J.B.1    Norton, M.G.2
  • 8
    • 0036640490 scopus 로고    scopus 로고
    • Tin whiskers studied by focused ion beam imaging and transmission electron microscopy
    • Shering G T T, Hu C F, Choi W J, Tu K N, Bong Y Y, and Nguyen L (2002) Tin whiskers studied by focused ion beam imaging and transmission electron microscopy. J. Appl. Phys. 92: 64-69.
    • (2002) J. Appl. Phys. , vol.92 , pp. 64-69
    • Shering, G.T.T.1    Hu, C.F.2    Choi, W.J.3    Tu, K.N.4    Bong, Y.Y.5    Nguyen, L.6
  • 9
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    • Private communication
    • Era H. Private communication
    • Era, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.