Real-time microscopy of reorientation driven nucleation and growth in pentacene thin films on silicon dioxide

Advanced Functional Materials

Volumn 23, Issue 20, 2013, Pages 2653-2660

  Al Mahboob, Abdullah ^a   Fujikawa, Yasunori ^b   Sakurai, Toshio ^c   Sadowski, Jerzy T ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b TOHOKU UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

monolayers; organic field effect transistors; self assembly; thin films

Indexed keywords

INTERFACIAL INTERACTION; LAYER-BY-LAYER GROWTH; LOW ENERGY ELECTRON MICROSCOPY; MOLECULAR REORIENTATION; NUCLEATION AND GROWTH; PENTACENE THIN FILMS; STRANSKI-KRASTANOV GROWTH; VOLMER-WEBER GROWTH MODE;

ELECTRON MICROSCOPY; ELECTRONS; EPITAXIAL GROWTH; MONOLAYERS; ORGANIC FIELD EFFECT TRANSISTORS; SELF ASSEMBLY; SILICA; SURFACE POTENTIAL; THIN FILMS;

FILM GROWTH;

EID: 84877813712     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201203427     Document Type: Article

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