Accurate determination of spring constant of atomic force microscope cantilever and comparison with other methods

18th IMEKO World Congress 2006: Metrology for a Sustainable Development

Volumn 1, Issue , 2006, Pages 57-61

  Kim, Min Seok ^a   Park, Yon Kyu ^a   Choi, Jae Hyuk ^a   Kang, Dae Im ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Atomic force microscopy; Calibration; Cantilever

Indexed keywords

AFM CANTILEVERS; ATOMIC FORCE MICROSCOPE CANTILEVERS; CALIBRATION DATA; CANTILEVER; FORCE SENSITIVITY; PIEZO-RESISTIVE; SELF-SENSING CANTILEVERS; SPRING CONSTANTS;

CALIBRATION; NANOCANTILEVERS; PLANNING; SPRINGS (COMPONENTS); SUSTAINABLE DEVELOPMENT; UNITS OF MEASUREMENT;

ATOMIC FORCE MICROSCOPY;

EID: 84877772754     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

1. M.F. Yu, O. Lourie, M. J. Dyer, K. Moloni, T. F. Kelly, and R. S. Ruoff, "Strength and breaking mechanism of multiwalled carbon nanotubes under tensile load, " Science Vol. 287, pp. 637-640, 2000.
2. A. Alessandrini and P. Facci, "AFM: a versatile tool in biophysics, " Meas. Sci. Technol. Vol. 16, R65, 2005.
3. T. Hugel, B. Nolland, A. Cattani, L. Moroder, M. Seitz and H. E. Gaub, "Single-Molecule Optomechaical Cycle, " Science Vol. 296, pp. 1103-1106, 2002.
4. J.P. Cleveland, S. Manne, D. Bocek and P.K. Hansma, "A nondestructive method for determining spring constant of cantilevers for scanning force microscopy, " Rev. Sci. Instrum. Vol. 64, pp. 403-405, 1993.
5. J.E. Sader, I. Larson, P. Mulvaney, and L.R. White, "Method for the calibration of atomic force microscope cantilevers, " Rev. Sci. Instrum., Vol. 66, pp. 3789-3798, 1995.
6. J.L. Hutter and J. Bechhoefer, "Calibration of atomicforce microscope tips, " Rev. Sci. Instrum. Vol. 64, pp. 1868-1873, 1993.
7. C.T. Gibson, G.S. Watson and S. Myhra, "Determination of the spring constants of probes for force microscopy/spectroscopy, " Nanotechnology Vol. 7, pp. 259-262, 1996.
8. A. Torii, M. Sasaki, K. Hane, and S. Okuma: "A method for determining the spring constant of cantilevers for atomic force microscopy, " Mea. Sci. Tech. Vol. 7, pp. 179-184, 1996.
9. J.D, Holbery, V.L. Eden, M. Sarikaya, and R.M. Fisher, "Experimental determination of scanning probe microscope cantilever spring constants utilizing a nanoindentation apparatus, " Rev. Sci. Instrum Vol. 71, pp. 3769-3776, 2000.
10. P.J. Cumpson, J. Hedley, and P. Zhdan, "Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration, " Nanotechnology Vol. 14, pp. 918-924, 2003.
11. N.A. Burnham, X. Chen, C.S. Hodges, G.A. Matei, E.J. Thoreson, C.J. Roberts, M.C. Davies and S.J.B. Tendler, "Comparison of calibration methods for atomic-force microscopy cantilevers, " Nanotechnology Vol. 14, pp. 1-6, 2003.
12. S.T. Smith, and L.P. Howard, "A precision, low-force balance and its application to atomic force microscope probe calibration, " Rev. Sci. Instrum Vol. 65, pp. 903- 909, 1994.
13. W. Hoffmann, S. Loheide, T. Kleine-Besten, U. Brand, and A. Schlacketzki, "Methods of characterizing micro mechanical beams and its calibration for the application in micro force measurement systems, " Proceeding of the MICRO tech., pp. 819-823, Hannover, 2000.
14. J.R. Pratt, D.T. Smith, D.B. Newell, J.A. Kramar, and E. Whitenton, "Progress toward Systeme International d'Unites traceable force metrology for nanomechanics, " J. Mater. Res. Vol. 19, pp. 366-379, 2004.
15. M. Tortonese and M. Kirk, "Characterization of application specific probes for SPMs, " Proceedings of SPIE, Vol. 3009, pp. 53-60, San Jose/California, 1997.