Characteristics of self-assembled ultrathin Nafion films

Macromolecules

Volumn 46, Issue 9, 2013, Pages 3461-3475

  Paul, Devproshad K ^a   Karan, Kunal ^a,c   Docoslis, Aristides ^a   Giorgi, Javier B ^b   Pearce, Joshua ^a,d  

^a QUEEN S UNIVERSITY   (Canada)

^b UNIVERSITY OF OTTAWA   (Canada)

^c UNIVERSITY OF CALGARY   (Canada)

^d Michigan Technological University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROPHILIC SURFACES; HYDROPHOBIC SURFACES; STRUCTURE AND PROPERTIES; SURFACE WETTABILITY; THICKNESS OF FILMS; THREE DIFFERENT TECHNIQUES; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY; WATER CONTACT ANGLE;

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; DISPERSIONS; HYDROPHILICITY; HYDROPHOBICITY; PHOTOELECTRONS; SILICON OXIDES; SILICON WAFERS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE CHEMISTRY; THICK FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ULTRATHIN FILMS;

EID: 84877756144     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma4002319     Document Type: Article

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