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Volumn 42, Issue 13, 2009, Pages 4769-4774

Multilamellar interface structures in Nafion

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION ISOTHERMS; INTERFACE STRUCTURES; INTERFACIAL LAYER; INTERFACIAL STRUCTURES; MEMBRANE ELECTRODE ASSEMBLIES; MULTILAMELLAR; NAFION FILM; NEUTRON REFLECTOMETRY; NUMBER OF LAYERS; PROTON EXCHANGE MEMBRANES;

EID: 67650544690     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma802823j     Document Type: Article
Times cited : (152)

References (39)
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    • Gebel, G. Polymer 2000, 41, 5829-5838.
    • (2000) Polymer , vol.41 , pp. 5829-5838
    • Gebel, G.1
  • 23
    • 67650511708 scopus 로고    scopus 로고
    • Certain commercial equipment, instruments, or materials or suppliers, or software, etc, are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose
    • Certain commercial equipment, instruments, or materials (or suppliers, or software, etc.) are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
  • 33
    • 67650535993 scopus 로고    scopus 로고
    • Kienzle, P. A.; O'Donovan, K. V.; Ankner, J. F.; Berk, N. F.; Majkrzak, G F. http://www.ncnr.nist.gov/reflpak, 2000-2006.
    • Kienzle, P. A.; O'Donovan, K. V.; Ankner, J. F.; Berk, N. F.; Majkrzak, G F. http://www.ncnr.nist.gov/reflpak, 2000-2006.
  • 34
    • 67650553429 scopus 로고    scopus 로고
    • DuPont Nafion PFSA membranes N-115, N-117, and N-1110 (technical document Copyright 2008 DuPont or its affiliates).
    • DuPont Nafion PFSA membranes N-115, N-117, and N-1110 (technical document Copyright 2008 DuPont or its affiliates).
  • 35
    • 67650564936 scopus 로고    scopus 로고
    • An alternative description has been also modeled though not fit to the data. In this model the sample is described as consisting of many individual subsamples in which a single five-layer set of lamellae are placed at different depths ZL from the SiO2 within the Nafion film. Since, in this model, these subsamples are larger than the neutron coherence length in the plane of the sample, the scattering from each subsample will add incoherently; i.e, the intensities will be added, If the individual layers were smaller than the coherence length of the neutron, only the average in-plane composition would contribute to the scattering, Models with narrow distributions of ZL centered away from either interface show a beating pattern of the oscillations, similar to the single sample models discussed in the text, which is also not consistent with the data. Broader distributions do not have such a beating pattern, but the intensity of the oscillations of the summed intensity fall und
    • 2 within the Nafion film. Since, in this model, these subsamples are larger than the neutron coherence length in the plane of the sample, the scattering from each subsample will add incoherently; i.e., the intensities will be added. (If the individual layers were smaller than the coherence length of the neutron, only the average in-plane composition would contribute to the scattering.) Models with narrow distributions of ZL centered away from either interface show a beating pattern of the oscillations, similar to the single sample models discussed in the text, which is also not consistent with the data. Broader distributions do not have such a beating pattern, but the intensity of the oscillations of the summed intensity fall under an envelope function which includes a broad peak at roughly half the Q value of the high-Q peak, which is not seen in the data, indicating that this model is not as good a fit to the data as one with a single set of lamellae located at the interface or surface of the Nafion film.
  • 39
    • 0344049363 scopus 로고    scopus 로고
    • Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, G F. Phys. Rev. Lett. 1989, 62, 1852-1855. (40) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, G F. Phys. Rev. Lett. 1992, 68, 67-70.
    • Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, G F. Phys. Rev. Lett. 1989, 62, 1852-1855. (40) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, G F. Phys. Rev. Lett. 1992, 68, 67-70.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.