Nanocharacterization and nanofabrication of a nafion thin film in liquids by atomic force microscopy

Langmuir

Volumn 22, Issue 7, 2006, Pages 3306-3312

  Umemura, Kazuo ^a,b   Wang, Tong ^c   Hara, Masahiko ^c   Kuroda, Reiko ^d   Uchida, On ^a   Nagai, Masayuki ^a  

^a TOKYO CITY UNIVERSITY   (Japan)

^b Kamoshita Planning   (Japan)

^c Discovery Research Institute   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACETIC ACID; ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; METHANOL; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SOLVENTS; WATER;

AFM IMAGES; AFM NANOLITHOGRAPHY; NAFION THIN FILM; NANOCHARACTERIZATION; NANOCLUSTERS; POLYMER FILM; SEQUENTIAL FORCE CURVE MEASUREMENTS;

THIN FILMS;

EID: 33645528977     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la051926t     Document Type: Article

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