Atomic force microscopy studies on the dewetting of perfluorinated ionomer thin films

Journal of Polymer Science, Part B: Polymer Physics

Volumn 41, Issue 2, 2003, Pages 149-158

  Hill, T A ^a   Carroll, D L ^b   Czerw, R ^b   Martin, C W ^a,c   Perahia, D ^a,b  

^a CLEMSON UNIVERSITY   (United States)

^b AMRL   (United States)

^c W L GORE AND ASSOCIATES   (United States)

Author keywords

Atomic force microscopy (AFM); Dewetting; Fluoropolymers; Ionomers

Indexed keywords

ATOMIC FORCE MICROSCOPY; HYDROPHILICITY; HYDROPHOBICITY; IONIC STRENGTH; IONOMERS; MICELLES; PLASTIC COATINGS; SOLUTIONS; SUPRAMOLECULAR CHEMISTRY; THIN FILMS;

DEWETTING;

PLASTIC FILMS;

EID: 0037438767     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.10362     Document Type: Article

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