-
2
-
-
0023588607
-
Electron beam sensitivity of zeolite L
-
Treacy M M J and Newsam J M (1987) Electron beam sensitivity of zeolite L. Ultramicroscopy 23: 411-419
-
(1987)
Ultramicroscopy
, vol.23
, pp. 411-419
-
-
Treacy, M.M.J.1
Newsam, J.M.2
-
3
-
-
0012178968
-
What can we observe in zeolite related materials by HRTEM?
-
Terasaki O and Ohsuna T (1995) What can we observe in zeolite related materials by HRTEM? Catal. Today 23: 201-218
-
(1995)
Catal. Today
, vol.23
, pp. 201-218
-
-
Terasaki, O.1
Ohsuna, T.2
-
4
-
-
0019284324
-
A new method for optimal-resolution electron microscopy of radiation-sensitive specimens
-
Fujiyoshi Y, Kobayashi T, Ishizuka K, Uyeda N, Ishida Y, and Harada Y (1980) A new method for optimal-resolution electron microscopy of radiation-sensitive specimens. Ultramicroscopy 5: 459-468
-
(1980)
Ultramicroscopy
, vol.5
, pp. 459-468
-
-
Fujiyoshi, Y.1
Kobayashi, T.2
Ishizuka, K.3
Uyeda, N.4
Ishida, Y.5
Harada, Y.6
-
5
-
-
79961038408
-
Radiolysis to knock-on damage transition in zeolites under electron beam irradiation
-
Ugurlu O, Haus J, Gunawan A A, Thomas M G, Maheshwari S, Tsapatsis M, and Mkhoyan K A (2011) Radiolysis to knock-on damage transition in zeolites under electron beam irradiation. Phys. Rev. B 83: 113408
-
(2011)
Phys. Rev. B
, vol.83
, pp. 113408
-
-
Ugurlu, O.1
Haus, J.2
Gunawan, A.A.3
Thomas, M.G.4
Maheshwari, S.5
Tsapatsis, M.6
Mkhoyan, K.A.7
-
6
-
-
0023982897
-
Vitrification of zeolite Y in the TEM
-
Csencsits R and Gronsky R (1988) Vitrification of zeolite Y in the TEM. Zeolites 8: 122-126
-
(1988)
Zeolites
, vol.8
, pp. 122-126
-
-
Csencsits, R.1
Gronsky, R.2
-
7
-
-
33745665836
-
Estimation of suitable condition for observing copper-phthalocyanine crystalline film by transmission electron microscopy
-
Hayashida M, Kawasaki T, Kimura Y, and Takai Y (2006) Estimation of suitable condition for observing copper-phthalocyanine crystalline film by transmission electron microscopy. Nucl. Instrum. Methods Phys. Res. B 248: 273-278
-
(2006)
Nucl. Instrum. Methods Phys. Res. B
, vol.248
, pp. 273-278
-
-
Hayashida, M.1
Kawasaki, T.2
Kimura, Y.3
Takai, Y.4
-
8
-
-
2442596122
-
Low-voltage electron microscopy of polymer and organic molecular thin films
-
Drummy L F, Yang J, and Martin D C (2004) Low-voltage electron microscopy of polymer and organic molecular thin films. Ultramicroscopy 99: 247-256
-
(2004)
Ultramicroscopy
, vol.99
, pp. 247-256
-
-
Drummy, L.F.1
Yang, J.2
Martin, D.C.3
-
9
-
-
77955512199
-
Basic questions related to electron-induced sputtering in the TEM
-
Egerton R F, McLeod R, Wang F, and Malac M (2010) Basic questions related to electron-induced sputtering in the TEM. Ultramicroscopy 110: 991-997
-
(2010)
Ultramicroscopy
, vol.110
, pp. 991-997
-
-
Egerton, R.F.1
McLeod, R.2
Wang, F.3
Malac, M.4
-
10
-
-
0020294763
-
Chemical aspects of electron-beam interactions in the solid state
-
Symons M C R (1982) Chemical aspects of electron-beam interactions in the solid state. Ultramicroscopy 10: 15-23
-
(1982)
Ultramicroscopy
, vol.10
, pp. 15-23
-
-
Symons, M.C.R.1
-
11
-
-
0023564870
-
Damage of zeolite Y in the TEM and its effects of TEM images
-
Csencsits R and Gronsky R (1987) Damage of zeolite Y in the TEM and its effects of TEM images. Ultramicroscopy 23: 421-432
-
(1987)
Ultramicroscopy
, vol.23
, pp. 421-432
-
-
Csencsits, R.1
Gronsky, R.2
-
12
-
-
0000716477
-
Methods to measure properties of slow-scan CCD cameras for electron detection
-
de Ruijter W J and Weiss J K (1992) Methods to measure properties of slow-scan CCD cameras for electron detection. Rev. Sci. Instrum. 63: 4314-4321
-
(1992)
Rev. Sci. Instrum
, vol.63
, pp. 4314-4321
-
-
De Ruijter, W.J.1
Weiss, J.K.2
-
13
-
-
67650544797
-
Detective quantum efficiency of electron area detectors in electron microscopy
-
McMullan G, Chen S, Henderson R, and Frauqi A R (2009) Detective quantum efficiency of electron area detectors in electron microscopy. Ultramicroscopy 109: 1126-1143
-
(2009)
Ultramicroscopy
, vol.109
, pp. 1126-1143
-
-
McMullan, G.1
Chen, S.2
Henderson, R.3
Frauqi, A.R.4
-
14
-
-
0016116857
-
Sensitivity and detective quantum efficiency of electron microscope plates at high voltages
-
Ast D G (1974) Sensitivity and detective quantum efficiency of electron microscope plates at high voltages. J. Appl. Phys. 45: 4638-4643
-
(1974)
J. Appl. Phys
, vol.45
, pp. 4638-4643
-
-
Ast, D.G.1
-
15
-
-
81055138199
-
Optimum HRTEM image contrast at 20 and 80 kV-exemplified by grapheme
-
Lee Z, Meyer J C, Rose H, and Kaiser U (2012) Optimum HRTEM image contrast at 20 and 80 kV-exemplified by grapheme. Ultramicroscopy 112: 39-46
-
(2012)
Ultramicroscopy
, vol.112
, pp. 39-46
-
-
Lee, Z.1
Meyer, J.C.2
Rose, H.3
Kaiser, U.4
-
16
-
-
19244377685
-
High resolution electron microscopy of zeolites
-
Pan M (1996) High resolution electron microscopy of zeolites. Micron 27: 219-238
-
(1996)
Micron
, vol.27
, pp. 219-238
-
-
Pan, M.1
-
17
-
-
0026414316
-
The study of zeolites by HVHREM
-
Terasaki O, Ohsuna T, Alfredsson V, Bovin J-O, Watanabe D, and Tsuno K (1991) The study of zeolites by HVHREM. Ultramicroscopy 39: 238-246
-
(1991)
Ultramicroscopy
, vol.39
, pp. 238-246
-
-
Terasaki, O.1
Ohsuna, T.2
Alfredsson, V.3
Bovin, J.-O.4
Watanabe, D.5
Tsuno, K.6
-
18
-
-
34247324384
-
Stability due to peripheral halogenation in phthalocyanine complexes
-
Koshino M, Kurata H, and Isoda S (2007) Stability due to peripheral halogenation in phthalocyanine complexes. Microsc. Microanal. 13: 96-107
-
(2007)
Microsc. Microanal
, vol.13
, pp. 96-107
-
-
Koshino, M.1
Kurata, H.2
Isoda, S.3
-
19
-
-
13944283748
-
Radiation damage analysis of 7,7,8,8,-tetracyanoquinodimethane (TCNQ) and 2,3,5,6,-tetrafluoro-7,7,8,8,-tetracyanoquinodimethane (F4TCNQ) by electron diffraction and electron energy loss spectroscopy
-
Koshino M, Hasegawa M Y, Nemoto T, Kurata H, and Isoda S (2005) Radiation damage analysis of 7,7,8,8,-tetracyanoquinodimethane (TCNQ) and 2,3,5,6,-tetrafluoro-7,7,8,8,-tetracyanoquinodimethane (F4TCNQ) by electron diffraction and electron energy loss spectroscopy. Micron 36: 271-279
-
(2005)
Micron
, vol.36
, pp. 271-279
-
-
Koshino, M.1
Hasegawa, M.Y.2
Nemoto, T.3
Kurata, H.4
Isoda, S.5
-
20
-
-
4644278638
-
Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 keV
-
Li P and Egerton R F (2004) Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 keV. Ultramicroscopy 101: 161-172
-
(2004)
Ultramicroscopy
, vol.101
, pp. 161-172
-
-
Li, P.1
Egerton, R.F.2
-
21
-
-
0036005956
-
Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates
-
Ohno T, Sengoku M, and Arii T (2002) Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates. Micron 33: 403-406
-
(2002)
Micron
, vol.33
, pp. 403-406
-
-
Ohno, T.1
Sengoku, M.2
Arii, T.3
-
22
-
-
0026816519
-
Effect of temperature on radiation damage to aromatic organic molecules
-
Fryer J R, McConnell C H, Zemlin F, and Dorset D L (1992) Effect of temperature on radiation damage to aromatic organic molecules. Ultramicroscopy 40: 163-169
-
(1992)
Ultramicroscopy
, vol.40
, pp. 163-169
-
-
Fryer, J.R.1
McConnell, C.H.2
Zemlin, F.3
Dorset, D.L.4
-
23
-
-
24444449143
-
On the location and disorder of the tetrapopylammonum (TPA) ion in zeolite ZSM-5 with improved framework accuracy
-
van Koningsveld H, van Bekkum H, and Jansen J C (1987) On the location and disorder of the tetrapopylammonum (TPA) ion in zeolite ZSM-5 with improved framework accuracy. Acta Crystallogr. B 43: 127-132
-
(1987)
Acta Crystallogr
, vol.B 43
, pp. 127-132
-
-
Van Koningsveld, H.1
Van Bekkum, H.2
Jansen, J.C.3
-
24
-
-
33845441250
-
Estimation of minimum electron dose necessary to resolve molecular structure of deoxyribonucleic acid by phase transmission electron microscopy
-
Nomaguchi T, Kimura Y, and Takai Y (2006) Estimation of minimum electron dose necessary to resolve molecular structure of deoxyribonucleic acid by phase transmission electron microscopy. Appl. Phys. Lett. 89: 231907
-
(2006)
Appl. Phys. Lett
, vol.89
, pp. 231907
-
-
Nomaguchi, T.1
Kimura, Y.2
Takai, Y.3
-
25
-
-
0036290065
-
High-resolution imaging with an aberration-corrected transmission electron microscope
-
Lentzen M, Jahnen B, Jia C L, Thust A, Tillmann K, and Urban K (2002) High-resolution imaging with an aberration-corrected transmission electron microscope. Ultramicroscopy 92: 233-242
-
(2002)
Ultramicroscopy
, vol.92
, pp. 233-242
-
-
Lentzen, M.1
Jahnen, B.2
Jia, C.L.3
Thust, A.4
Tillmann, K.5
Urban, K.6
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