High resolution electron microscopy of zeolites

Micron

Volumn 27, Issue 3-4, 1996, Pages

  Pan, M ^a,b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b GATAN INC   (United States)

Author keywords

2D 3 connected net; ABC 6; beta; digital diffractogram; EMT; erionite; FAU; HREM; intergrowth; low dose; offretite; online image acquisition; online image evaluation; projected potential maps; quantitative image analysis; radiation damage; real space averaging; slow scan CCD camera; sodalite; SSZ 26; SSZ 33; stacking fault; structural determination; tschernichite; zeolites; ZSM 5

Indexed keywords

EID: 19244377685     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/0968-4328(96)84210-7     Document Type: Review

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