Structural and electrical studies on nanostructured InSe thin films

Applied Surface Science

Volumn 276, Issue , 2013, Pages 210-216

  Darwish, A A A ^a,b   El Nahass, M M ^c   Bahlol, M H ^d  

^a UNIVERSITY OF TABUK   (Saudi Arabia)

^b SANA A UNIVERSITY   (Yemen)

^c Ain Shams University   (Egypt)

^d Amran University   (Yemen)

Author keywords

Evaporation; InSe thin films; SCLC

Indexed keywords

CRYSTALLITE SIZE; EVAPORATION; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; TEMPERATURE DISTRIBUTION; THERMOELECTRICITY; THIN FILMS; X RAY DIFFRACTION;

CURRENT DENSITY-VOLTAGE CHARACTERISTICS; ELECTRICAL CONDUCTIVITY; EXPONENTIAL DISTRIBUTIONS; INSE THIN FILMS; SCLC; SPACE CHARGE LIMITED CONDUCTIVITIES; TEMPERATURE DEPENDENCE; THERMOELECTRIC PROPERTIES;

INDIUM COMPOUNDS;

EID: 84877574609     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.03.068     Document Type: Article

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