Structural and electrical properties of InSe polycrystalline films and diode fabrication

Thin Solid Films

Volumn 510, Issue 1-2, 2006, Pages 247-250

  Hirohata, Atsufumi ^a   Moodera, Jagadeesh S ^a   Berera, Geetha P ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

InSe; Phase change; Schottky diodes

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; RAMAN SPECTROSCOPY; SCHOTTKY BARRIER DIODES; X RAY DIFFRACTION;

DIODE FABRICATION; INSE; PHASE CHANGE; POLYCRYSTALLINE FILMS;

POLYCRYSTALLINE MATERIALS;

EID: 33646409588     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.202     Document Type: Article

References (15)

1. Kenawy M.A., Zayed H.A., and El-Soud A.M.A. J. Mater. Sci., Mater. Electron. 1 (1990) 115
2. Julien C., Hatzikraniotis E., Chevy A., and Kambas K. Mater. Res. Bull. 20 (1985) 287
3. Ulrich C., Olguin D., Cantarero A., Goñi A.R., Syassen K., and Chevy A. Phys. Status Solidi, B Basic Res. 221 (2000) 777
4. Yudasaka M., Matsuoka T., and Nakanishi K. Thin Solid Films 146 (1987) 65
5. de Groot C.H., and Moodera J.S. J. Appl. Phys. 89 (2001) 4336
6. Chaiken A., Nauka K., Gibson G.A., Lee H., Yang C.C., Wu J., Ager J.W., Yu K.M., and Walukiewicz W. J. Appl. Phys. 94 (2003) 2390
7. Gibson G.A., Chaiken A., Nauka K., Yang C.C., Davidson R., Holden A., Bicknell R., Yeh B.S., Chen J., Liao H., Subramanian S., Schult D., Jasinski J., and Liliental-Weber Z. Appl. Phys. Lett. 86 (2005) 051902
8. Shigetomi S., and Ikari T. J. Appl. Phys. 88 (2000) 1520
9. In: Hesselink L., and Mijiritskii A. (Eds). Advanced Data Storage Materials and Characterization Techniques. Materials Research Society Symposium Proceeding vol. 803 (2003)
10. Eleftheriou E., Antonakopoulos T., Binnig G.K., Cherubini G., Despont M., Dholakia A., Dürig U., Lantz M.A., Pozidis H., Rothuizen H.E., and Vettiger P. IEEE Trans. Magn. 39 (2003) 938
11. Parlak M., Erçelebi C., Grünal I., Salaeva Z., and Allakhverdiev K. Thin Solid Films 258 (1995) 86
12. Kuroda N., and Nishina Y. Solid State Commun. 8 (1978) 439
13. Balitski O.A., Savchyn V.P., and Yukhymchuk V.O. Semicond. Sci. Technol. 17 (2002) L1
14. Sze S.M. Physics of Semiconductor Devices. 2nd ed. (1981), John Wiley & Sons, New York, NY
15. Simmons J.G. J. Appl. Phys. 34 (1963) 1793