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Volumn 41, Issue 2, 2005, Pages 1034-1036

Switching behavior of indium selenide-based phase-change memory cell

Author keywords

Indium selenide (In2Se3); Phase change random access memory (PRAM); Pulsed mode switching; Static mode switching

Indexed keywords

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; INDIUM ALLOYS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; RESISTORS; SWITCHING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 14544287707     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.842032     Document Type: Article
Times cited : (70)

References (5)
  • 1
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    • Ovshinsky, S.R.1
  • 2
    • 0035717521 scopus 로고    scopus 로고
    • OUM - A 180 nm nonvolatile memory cell element technology
    • S. Lai and T. Lowrey, "OUM - a 180 nm nonvolatile memory cell element technology," in IEDM Tech. Dig., 2001, p. 803.
    • (2001) IEDM Tech. Dig. , pp. 803
    • Lai, S.1    Lowrey, T.2
  • 3
    • 0842328201 scopus 로고    scopus 로고
    • For stand alone and embedded applications ovonic unified memory - A high-performance nonvolatile memory technology for stand alone memory and embedded applications
    • M. Gill, T. Lowery, and J. Park, "For stand alone and embedded applications ovonic unified memory - a high-performance nonvolatile memory technology for stand alone memory and embedded applications," in Proc. ISSCC, 2002, p. 202.
    • (2002) Proc. ISSCC , pp. 202
    • Gill, M.1    Lowery, T.2    Park, J.3
  • 4
    • 0842309810 scopus 로고    scopus 로고
    • Current status of the phase change memory and its future
    • S. Lai, "Current status of the phase change memory and its future," in IEDM Tech. Dig., 2003, p. 255.
    • (2003) IEDM Tech. Dig. , pp. 255
    • Lai, S.1
  • 5
    • 0141426789 scopus 로고    scopus 로고
    • Full integration and reliability evaluation of phase-change RAM based on 0.24 μm-CMOS technologies
    • Y. N. Hwang et al., "Full integration and reliability evaluation of phase-change RAM based on 0.24 μm-CMOS technologies," in VLSI Symp. Tech. Dig., 2003, p. 173.
    • (2003) VLSI Symp. Tech. Dig. , pp. 173
    • Hwang, Y.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.