Thickness and temperature effects on electrical resistivity of (Bi0.5Sb0.5)2Te3 thin films

Materials Letters

Volumn 60, Issue 17-18, 2006, Pages 2059-2065

  Ganesan, P G ^a   Das, V Damodara ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Bi Sb Te thin films; Electrical resistivity; Size effect

Indexed keywords

ELECTRIC CONDUCTIVITY; EVAPORATION; GRAIN GROWTH; THERMAL EFFECTS; X RAY DIFFRACTION;

BI-SB-TE THIN FILMS; GLASS SUBSTRATE; SIZE EFFECT;

THIN FILMS;

EID: 33646577788     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2006.02.025     Document Type: Article

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