Optical properties of nanostructured InSe thin films

Optics Communications

Volumn 285, Issue 6, 2012, Pages 1221-1224

  El Nahass, M M ^a   Saleh, Abdul Basit A ^b   Darwish, A A A ^c   Bahlol, M H ^d  

^a Ain Shams University   (Egypt)

^b JAZAN UNIVERSITY   (Saudi Arabia)

^c SANA A UNIVERSITY   (Yemen)

^d Amran University   (Yemen)

Author keywords

InSe thin films; Optical properties; Thermal evaporation

Indexed keywords

ABSORPTION INDEXES; AS-DEPOSITED FILMS; COMPUTER PROGRAM; CRYSTALLINE NATURE; DEGREE OF CRYSTALLINITY; INSE THIN FILMS; NANO SCALE; NANO-STRUCTURED; NANOCRYSTALLINE THIN FILMS; NORMAL INCIDENCE; OPTICAL DISPERSION; SINGLE-OSCILLATOR MODEL; SPECTROPHOTOMETRIC MEASUREMENTS; THERMAL EVAPORATION TECHNIQUE; WAVELENGTH RANGES;

OPTICAL CONSTANTS; OPTICAL PROPERTIES; PHASE TRANSITIONS; REFRACTIVE INDEX; THERMAL EVAPORATION; THIN FILMS;

OPTICAL FILMS;

EID: 84855906804     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2011.11.031     Document Type: Article

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