A fully integrated hall sensor microsystem for contactless current measurement

IEEE Sensors Journal

Volumn 13, Issue 6, 2013, Pages 2271-2278

  Ajbl, Andrea ^a   Pastre, Marc ^a   Kayal, Maher ^a  

^a EPFL   (Switzerland)

Author keywords

Current output; full integration; Hall effect sensor; sensitivity calibration

Indexed keywords

CURRENT OUTPUT; DESIGN CHALLENGES; HALL-EFFECT SENSORS; OPEN-LOOP CONFIGURATION; SENSITIVITY CALIBRATION; SYSTEM INTEGRATION; SYSTEM SENSITIVITY; TEMPERATURE DEPENDENT;

CALIBRATION; ELECTRIC CURRENT MEASUREMENT; MICROSYSTEMS; PRECISION ENGINEERING;

HALL EFFECT TRANSDUCERS;

EID: 84877251446     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2013.2251971     Document Type: Article

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