A Hall sensor microsystem with continuous gain calibration using fully integrated references

ISCAS 2012 - 2012 IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2012, Pages 1399-1402

  Ajbl, Andrea ^a   Pastre, Marc ^a   Kayal, Maher ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS TECHNOLOGY; CURRENT MODE; CURRENT REFERENCE; FULL INTEGRATION; FULLY DIFFERENTIAL; FULLY INTEGRATED; GAIN CALIBRATION; GAIN STABILITY; HALL SENSOR; INTEGRATED SYSTEMS; INTERNAL BIASING; INTERNAL VOLTAGE; VOLTAGE-TO-CURRENT CONVERTERS;

CALIBRATION; CMOS INTEGRATED CIRCUITS; HALL EFFECT TRANSDUCERS;

MICROSYSTEMS;

EID: 84866601857     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2012.6271505     Document Type: Conference Paper

References (8)

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2. D. Manic, J. Petr, R. S. Popovic,"Temperature cross-sensitivity of Hall plate in submicron CMOS technology," Sensors and Actuators A: Physical, Volume 85, Issues 1-3, 25 August 2000, Pages 244-248
3. M. Pastre, M. Kayal, H. Blanchard,"A Hall Sensor Analog Front End for Current Measurement with Continuous Gain Calibration", IEEE International Solid-State Circuits Conference (ISSCC), pp. 242-243, 596, February 2005
4. R. S. Popovic, Hall Effect Devices, 2nd ed. Bristol, U. K., Inst. Physics Publishing, 2004
5. A. Ajbl, M. Pastre, M. Kayal,"Inversion Factor Based Design Methodology Using EKV MOS Model", Mixed Design of Integrated Circuits and Systems (MIXDES), 2011 Proceedings of the 18th International Conference , pp. 90-94, 16-18 June 2011
6. C. C. Enz, E. A. Vittoz, F. Krummenacher,"A CMOS chopper amplifier", IEEE Journal of Solid-State Circuits, vol. 22, no. 3, pp. 335342, Jun 1987
7. A. Ajbl, M. Pastre, M. Kayal,"A current-mode back-end for a sensor microsystem", New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International, pp. 466-469, 26-29 June 2011
8. K. Ueno, T. Hirose, T. Asai, Y. Amemiya,"A 300 nW, 15 ppm/°C, 20 ppm/V CMOS Voltage Reference Circuit Consisting of Subthreshold MOSFETs", IEEE Journal of Solid-State Circuits, vol. 44, no. 7, pp. 2047-2054, July 2009