Package stress monitor to compensate for the piezo-hall effect in CMOS Hall sensors

Proceedings of IEEE Sensors

Volumn , Issue , 2012, Pages

  Huber, Samuel ^a   Schott, Christian ^a   Paul, Oliver ^b  

^a Melexis NV   (Belgium)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS COMPATIBLE; CONVENTIONAL SENSORS; CROSS SENSITIVITY; DIFFERENTIAL OUTPUT SIGNALS; DOPING CONCENTRATION; HALL PLATES; HALL SENSOR; MEASURED SIGNALS; OUTPUT SIGNAL; P-TYPE; PIEZO-HALL EFFECTS; PIEZORESISTOR; S-BRIDGE; STRESS SENSOR; WHEATSTONE BRIDGES;

BRIDGE CIRCUITS; HALL EFFECT; HALL EFFECT TRANSDUCERS;

SENSORS;

EID: 84873950353     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2012.6411120     Document Type: Conference Paper

References (13)

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