Preparation of manganese-doped ZnO thin films and their characterization

Bulletin of Materials Science

Volumn 36, Issue 2, 2013, Pages 223-229

  Mondal, S ^a   Bhattacharyya, S R ^b   Mitra, P ^a  

^a UNIVERSITY OF BURDWAN   (India)

^b SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Mn:ZnO thin film; Optical bandgap; SEM; SILAR; X ray line broadening

Indexed keywords

AVERAGE PARTICLE SIZE; FUNDAMENTAL ABSORPTION EDGE; MANGANESE INCORPORATION; MANGANESE-DOPED ZINC OXIDES; SILAR; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL CHARACTERIZATION; X-RAY LINE BROADENING;

FILM GROWTH; MANGANESE OXIDE; METALLIC FILMS; OPTICAL BAND GAPS; OPTICAL FILMS; OPTICAL PROPERTIES; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; X RAY DIFFRACTION; ZINC OXIDE;

MANGANESE;

EID: 84876964174     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-013-0462-3     Document Type: Article

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