Preparation of cadmium-doped ZnO thin films by SILAR and their characterization

Bulletin of Materials Science

Volumn 35, Issue 5, 2012, Pages 751-757

  Mondal, S ^a   Mitra, P ^a  

^a UNIVERSITY OF BURDWAN   (India)

Author keywords

Cd:ZnO thin film; Optical bandgap; SEM; SILAR; X ray line broadening

Indexed keywords

AVERAGE PARTICLE SIZE; C-AXIS ORIENTATIONS; FUNDAMENTAL ABSORPTION EDGE; ION LAYER ADSORPTION; POLYCRYSTALLINE; POLYCRYSTALLINITY; PURE ZNO; SILAR; STRUCTURAL CHARACTERIZATION; X-RAY LINE BROADENING; ZNO; ZNO THIN FILM;

METALLIC FILMS; OPTICAL BAND GAPS; OPTICAL FILMS; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SODIUM; X RAY DIFFRACTION; ZINC OXIDE;

CADMIUM;

EID: 84868259166     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-012-0350-2     Document Type: Article

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