The structure of MCM-48 determined by electron crystallography

Journal of Electron Microscopy

Volumn 48, Issue 6, 1999, Pages 795-798

  Carlsson, Anna ^a   Kaneda, Mizue ^a   Sakamoto, Yasuhiro ^a   Terasaki, Osamu ^a,b   Ryoo, Ryong ^c   Joo, Sang Hoon ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Electron crystallography; HRTEM; Image processing; MCM 48; Mesoporous materials; Structure determination

Indexed keywords

ELECTRON DIFFRACTION; ELECTRONS; FOURIER TRANSFORMS; MESOPOROUS MATERIALS; X RAY CRYSTALLOGRAPHY;

ELECTRON CRYSTALLOGRAPHY; GYROID SURFACES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGES PROCESSING; MCM-48; MINIMAL SURFACES; SELECTED AREA ELECTRON DIFFRACTION; STRUCTURE DETERMINATION; THREE-DIMENSIONAL STRUCTURE; WALL THICKNESS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033492589     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023751     Document Type: Conference Paper

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