SCOPUS 정보 검색 플랫폼

Volumn , Issue 33, 2008, Pages 3894-3896

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ZEOLITE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTRON; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY;

EID: 50249146850 PISSN: 13597345 EISSN: None Source Type: Journal
DOI: 10.1039/b804440f Document Type: Article

Times cited : (12)

References (14)

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