Incommensurate modulation in the microporous silica SSZ-24

Chemistry - A European Journal

Volumn 8, Issue 19, 2002, Pages 4549-4556

  Liu, Zheng ^a   Fujita, Nobuhisa ^a   Terasaki, Osamu ^a   Ohsuna, Tetsu ^b   Hiraga, Kenji ^b   Camblor, Miguel A ^c   Díaz Cabañas, Maria José ^c   Cheetham, Anthony K ^d  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c University of California ^*  (Spain)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Electron microscopy; Rigid unit mode model; Silicates; Soft phonon modes; Zeolites

Indexed keywords

ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; MODULATION; NUCLEAR MAGNETIC RESONANCE; PHONONS; X RAY DIFFRACTION;

WAVE VECTORS;

SILICA;

SILICON DERIVATIVE; SILICON DIOXIDE; ZEOLITE;

ANALYTIC METHOD; ARTICLE; ELECTRON MICROSCOPY; HEAT TREATMENT; IRRADIATION; MOLECULAR MODEL; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; ROOM TEMPERATURE; STRUCTURE ANALYSIS; THERMOSTABILITY; X RAY POWDER DIFFRACTION;

EID: 0037020295     PISSN: 09476539     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3765(20021004)8:19<4549::AID-CHEM4549>3.0.CO;2-Z     Document Type: Article

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