Measurements of screening length in salt solutions by total internal reflection microscopy: Influence of van der Waals forces and instrumental noise

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 429, Issue , 2013, Pages 74-81

  Nayeri, M ^a   Abbas, Z ^a   Bergenholtz, J ^a  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

Author keywords

Brownian dynamics; Computer simulation; Electrolyte; Electrostatic interaction; Interaction potential; Latex; Noise; Screening; Total internal reflection microscopy; Van der Waals interactions

Indexed keywords

BROWNIAN MOVEMENT; COMPUTER SIMULATION; COULOMB INTERACTIONS; CRITICAL MICELLE CONCENTRATION; IONIC STRENGTH; LATEXES; REFRACTIVE INDEX; SCREENING; SURFACE ROUGHNESS; VAN DER WAALS FORCES;

BROWNIAN DYNAMICS; INTERACTION POTENTIALS; NOISE; TOTAL INTERNAL REFLECTION MICROSCOPY; VAN DER WAALS INTERACTIONS;

ELECTROLYTES;

ELECTROLYTE; SODIUM CHLORIDE; SURFACTANT;

ARTICLE; CHEMICAL INTERACTION; CONCENTRATION (PARAMETERS); CRITICAL MICELLE CONCENTRATION; FORCE; GRAVITY; MICROSCOPY; NOISE; PARTICLE SIZE; PRIORITY JOURNAL; THEORY; TOTAL INTERNAL REFLECTION MICROSCOPY; VAN DER WAALS FORCE;

EID: 84876887285     PISSN: 09277757     EISSN: 18734359     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2013.03.058     Document Type: Article

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