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Volumn 114, Issue 22, 2001, Pages 10094-10104
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Measurement of surface charge densities on Brownian particles using total internal reflection microscopy
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BOUNDARY CONDITIONS;
BROWNIAN MOVEMENT;
DENSITY (SPECIFIC GRAVITY);
ELECTROLYTES;
ELECTROPHORESIS;
INTEGRAL EQUATIONS;
LASER BEAMS;
PERMITTIVITY;
PHASE EQUILIBRIA;
POLYSTYRENES;
SALTS;
SILICA;
TOTAL INTERNAL REFLECTION MICROSCOPY (TIRM);
COLLOIDS;
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EID: 0035827173
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1371556 Document Type: Article |
Times cited : (64)
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References (43)
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