Direct measurement of retarded van der Waals attraction

Langmuir

Volumn 15, Issue 23, 1999, Pages 7925-7936

  Bevan, Michael A ^a,b   Prieve, Dennis C ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; DIFFUSION; IONIC STRENGTH; LATEXES; MOLECULAR DYNAMICS; POLYSTYRENES; SOLUTIONS; SURFACE ROUGHNESS; THICK FILMS;

POLYSTYRENE FILM; TOTAL INTERNAL REFLECTION MICROSCOPY;

VAN DER WAALS FORCES;

EID: 0033324254     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981381l     Document Type: Article

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