Ion specificity at low salt concentrations investigated with total internal reflection microscopy

Journal of Physical Chemistry C

Volumn 115, Issue 5, 2011, Pages 2284-2289

  Ao, Zhuo ^a   Liu, Guangming ^a   Zhang, Guangzhao ^a,b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b SOUTH CHINA UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CATION INTERACTIONS; COUNTERIONS; DEBYE LENGTH; DIRECT INTERACTIONS; DOUBLE LAYERS; EFFECTIVE SIZE; ELECTRICAL DOUBLE LAYERS; GLASS SLIDES; INTERACTION POTENTIALS; ION SPECIFICITY; LOW SALT CONCENTRATION; MINIMUM POTENTIAL ENERGY; PARTICLE SURFACE; POTENTIAL PROFILES; SALT SOLUTION; SEPARATION DISTANCES; SULFATE GROUPS; SURFACE FORCES; TOTAL INTERNAL REFLECTION MICROSCOPY; WATER AFFINITY;

ELECTRIC PROPERTIES; POLYSTYRENES; POSITIVE IONS; POTENTIAL ENERGY; REFRACTIVE INDEX;

NEGATIVE IONS;

EID: 79952651982     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp110782g     Document Type: Article

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